The investigation of structural, electrical, and optical properties of thermal evaporated AgGaS2 thin films

H. Karaagac, M. Parlak*

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Araştırma sonucu: ???type-name???Makalebilirkişi

16 Atıf (Scopus)

Özet

AgGaS2 (AGS) thin films were deposited onto glass substrates by sequential thermal evaporation of AgGaS2 single crystalline powder and excess silver (Ag) interlayer. Systematic optimization to obtain single phase AgGaS2 thin films was carried out by changing the thickness of the excess silver layer. The structure and composition of as-grown and annealed films were studied by means of X-ray diffraction and energy dispersive X-ray analysis, respectively. The optical properties of AGS thin films determined by transmittance and reflection measurements showed that they had quite high absorption coefficient with the values around 104 (cm-1). The calculated band gap values were found to be between 2.30 and 2.75 eV depending on annealing temperature. The refractive index (n) and extinction coefficient (k) of the films were determined by the envelope method. Finally, photo-electrical measurements under different illumination intensities were carried out, and different sensitizing and recombination centers were defined.

Orijinal dilİngilizce
Sayfa (başlangıç-bitiş)2055-2061
Sayfa sayısı7
DergiThin Solid Films
Hacim519
Basın numarası7
DOI'lar
Yayın durumuYayınlandı - 31 Oca 2011
Harici olarak yayınlandıEvet

Finansman

This work was supported by Turkish Scientific and Research Council (TUBITAK) under Grant no. 108T019 .

FinansörlerFinansör numarası
TUBITAK108T019
Turkish Scientific and Research Council

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