Surrogate-model-based analysis of analog circuits-part I: Variability analysis

Mustafa Berke Yelten*, Paul D. Franzon, Michael B. Steer

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31 Atıf (Scopus)

Özet

In this paper, an integrated variability and reliability analysis method based on surrogate models is introduced. The surrogate models here are response surfaces that describe a parametrized complex analytic function. Surrogate models are developed for the drain currents of 65-nm NMOS and PMOS devices in terms of critical process components, terminal voltages, temperature, and time and are based on BSIM model equations. A simulation technique is developed which incorporates the effect of process variations into the design procedure. These models and techniques are verified using circuit simulations of a single transistor and differential amplifier designs.

Orijinal dilİngilizce
Makale numarası5893924
Sayfa (başlangıç-bitiş)466-473
Sayfa sayısı8
DergiIEEE Transactions on Device and Materials Reliability
Hacim11
Basın numarası3
DOI'lar
Yayın durumuYayınlandı - Eyl 2011
Harici olarak yayınlandıEvet

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