Spin resolved imaging with scanning field-emission microscopy

U. Ramsperger; L. G. De Pietro; G. Bertolini; H. Cabrera; J. Zhou; O. Gurlu; A. Vindigni; D. Pescia

doi:10.1109/IVNC.2018.8520178

Spin resolved imaging with scanning field-emission microscopy

U. Ramsperger
, L. G. De Pietro
, G. Bertolini
, H. Cabrera
, J. Zhou
, O. Gurlu
, A. Vindigni
, D. Pescia

Swiss Federal Institute of Technology Zurich

Araştırma sonucu: Kitap/Rapor/Konferans Bildirisinde Bölüm › Konferans katkısı › bilirkişi

Özet

Secondary electrons emitted from a scanning fieldemission microscope are spin analyzed with a Mott detector. Spin polarization up to 15% is observed with a lateral resolution of less than 5 nm, with a potential resolution of even less than 1 nm. In this paper the proof of principle is conducted by comparing this method with a well-established method of spin mapping and with reference samples examined by these two microscopes.

Orijinal dil	İngilizce
Ana bilgisayar yayını başlığı	2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018
Yayınlayan	Institute of Electrical and Electronics Engineers Inc.
ISBN (Elektronik)	9781538657171
DOI'lar	https://doi.org/10.1109/IVNC.2018.8520178
Yayın durumu	Yayınlandı - 1 Kas 2018
Harici olarak yayınlandı	Evet
Etkinlik	31st International Vacuum Nanoelectronics Conference, IVNC 2018 - Kyoto, Japan Süre: 9 Tem 2018 → 13 Tem 2018

Yayın serisi

Adı	2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018

???event.eventtypes.event.conference???

???event.eventtypes.event.conference???	31st International Vacuum Nanoelectronics Conference, IVNC 2018
Ülke/Bölge	Japan
Şehir	Kyoto
Periyot	9/07/18 → 13/07/18

Bibliyografik not

Publisher Copyright:
© 2018 IEEE.

Finansman

ACKNOWLEDGMENT We would like to thank T. Michlmayr, Y. Acremann, U. Maier and T. Bähler for technical assistance. We also thank the European Commission (SIMDALEE2: Marie Curie Initial Training Network (ITN), grant number 606988 under FP7-PEOPLE-2013-ITN), the Swiss National Science Foundation (SNF grant number 20-134422) and the Commission for Technology and Innovation (CTI grant number 9860.1 PFNM-NM) for financially supporting this work.

Finansörler	Finansör numarası
Seventh Framework Programme	606988
European Commission	FP7-PEOPLE-2013-ITN
Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung	20-134422
Kommission für Technologie und Innovation	9860.1 PFNM-NM

Belgeye Erişim

10.1109/IVNC.2018.8520178

Diğer Dosyalar ve Linkler

Link to publication in Scopus

Alıntı Yap

Ramsperger, U., De Pietro, L. G., Bertolini, G., Cabrera, H., Zhou, J., Gurlu, O., Vindigni, A., & Pescia, D. (2018). Spin resolved imaging with scanning field-emission microscopy. In 2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018 Makale 8520178 (2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IVNC.2018.8520178

@inproceedings{8b27dd29921e45f795f3576ab2873aa2,

title = "Spin resolved imaging with scanning field-emission microscopy",

abstract = "Secondary electrons emitted from a scanning fieldemission microscope are spin analyzed with a Mott detector. Spin polarization up to 15\% is observed with a lateral resolution of less than 5 nm, with a potential resolution of even less than 1 nm. In this paper the proof of principle is conducted by comparing this method with a well-established method of spin mapping and with reference samples examined by these two microscopes.",

keywords = "Electron Microscopy, Field Emission, Magnetic Imaging, Secondary Electrons",

author = "U. Ramsperger and \{De Pietro\}, \{L. G.\} and G. Bertolini and H. Cabrera and J. Zhou and O. Gurlu and A. Vindigni and D. Pescia",

note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 31st International Vacuum Nanoelectronics Conference, IVNC 2018 ; Conference date: 09-07-2018 Through 13-07-2018",

year = "2018",

month = nov,

day = "1",

doi = "10.1109/IVNC.2018.8520178",

language = "English",

series = "2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018",

address = "United States",

}

Ramsperger, U, De Pietro, LG, Bertolini, G, Cabrera, H, Zhou, J, Gurlu, O, Vindigni, A & Pescia, D 2018, Spin resolved imaging with scanning field-emission microscopy. in 2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018., 8520178, 2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018, Institute of Electrical and Electronics Engineers Inc., 31st International Vacuum Nanoelectronics Conference, IVNC 2018, Kyoto, Japan, 9/07/18. https://doi.org/10.1109/IVNC.2018.8520178

Spin resolved imaging with scanning field-emission microscopy. / Ramsperger, U.; De Pietro, L. G.; Bertolini, G. et al.
2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018. Institute of Electrical and Electronics Engineers Inc., 2018. 8520178 (2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018).

Araştırma sonucu: Kitap/Rapor/Konferans Bildirisinde Bölüm › Konferans katkısı › bilirkişi

TY - GEN

T1 - Spin resolved imaging with scanning field-emission microscopy

AU - Ramsperger, U.

AU - De Pietro, L. G.

AU - Bertolini, G.

AU - Cabrera, H.

AU - Zhou, J.

AU - Gurlu, O.

AU - Vindigni, A.

AU - Pescia, D.

PY - 2018/11/1

Y1 - 2018/11/1

N2 - Secondary electrons emitted from a scanning fieldemission microscope are spin analyzed with a Mott detector. Spin polarization up to 15% is observed with a lateral resolution of less than 5 nm, with a potential resolution of even less than 1 nm. In this paper the proof of principle is conducted by comparing this method with a well-established method of spin mapping and with reference samples examined by these two microscopes.

AB - Secondary electrons emitted from a scanning fieldemission microscope are spin analyzed with a Mott detector. Spin polarization up to 15% is observed with a lateral resolution of less than 5 nm, with a potential resolution of even less than 1 nm. In this paper the proof of principle is conducted by comparing this method with a well-established method of spin mapping and with reference samples examined by these two microscopes.

KW - Electron Microscopy

KW - Field Emission

KW - Magnetic Imaging

KW - Secondary Electrons

UR - https://www.scopus.com/pages/publications/85057436732

U2 - 10.1109/IVNC.2018.8520178

DO - 10.1109/IVNC.2018.8520178

M3 - Conference contribution

AN - SCOPUS:85057436732

T3 - 2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018

BT - 2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 31st International Vacuum Nanoelectronics Conference, IVNC 2018

Y2 - 9 July 2018 through 13 July 2018

ER -

Ramsperger U, De Pietro LG, Bertolini G, Cabrera H, Zhou J, Gurlu O et al. Spin resolved imaging with scanning field-emission microscopy. In 2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018. Institute of Electrical and Electronics Engineers Inc. 2018. 8520178. (2018 31st International Vacuum Nanoelectronics Conference, IVNC 2018). doi: 10.1109/IVNC.2018.8520178

Spin resolved imaging with scanning field-emission microscopy

Özet

Yayın serisi

???event.eventtypes.event.conference???

Bibliyografik not

Finansman

Belgeye Erişim

Diğer Dosyalar ve Linkler

Parmak izi

Alıntı Yap