Scanning Field Emission Microscopy with Polarization Analysis (SFEMPA)

G. Bertolini, L. De Pietro, Th Bähler, H. Cabrera, O. Gürlü, D. Pescia, U. Ramsperger*

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4 Atıf (Scopus)


In the Fowler-Nordheim regime of Scanning Tunneling Microscopy (STM) the tip-target distance is few nanometers to few tens of nanometers. In this situation the tunneling between tip and target is completely suppressed. Instead, electrons can be field-emitted from the tip and their impact with the target might excite electrons off the surface. Under certain circumstances, the excited electrons escape the tip-target junction and build a new electronic system, absent in the tunneling regime of STM. A recent experiment discovered that this electronic system is spin polarized at nanoscale tip-target distances. Here we provide a comprehensive review of all strategies that have been adopted to perform the spin polarized experiments in the Fowler-Nordheim regime of STM. We also present new data that complement the proof of spin polarization and specifically underline the magnetic imaging potential of this new technology, which we call Scanning Field Emission Microscopy with Polarization Analysis (SFEMPA).

Orijinal dilİngilizce
Makale numarası146865
DergiJournal of Electron Spectroscopy and Related Phenomena
Yayın durumuYayınlandı - May 2020

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Publisher Copyright:
© 2019 The Authors


We thank Y. Acremann, U. Meier, T. Michlmayr for technical assistance and Mrs. Heidi Hostettler for the photographs in Fig. 1 . We thank C. Walker for critical reading of the manuscript. We also thank the European Commission (SIMDALEE2: Marie Curie Initial Training Network (ITN), Grant number 606988 under FP7-PEOPLE-2013-ITN), the Swiss National Science Foundation (SNF grant number 20-134422 ) and the Commission for Technology and Innovation (CTI grant number 9860.1 PFNM-NM ) for financing this work.

FinansörlerFinansör numarası
Seventh Framework Programme606988
European CommissionFP7-PEOPLE-2013-ITN
Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung20-134422
Kommission für Technologie und Innovation9860.1 PFNM-NM

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