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On the study of comparative analysis of dielectric loaded effects for rectangular cavity resonators

  • Istanbul Technical University
  • Vestel

Araştırma çıktısı: Kitap/Rapor/Konferans Bildirisinde BölümKonferans katkısıHakem

3 Atıf (Scopus)

Özet

In this paper, a comparison study of dielectric loaded effects of rectangular resonant cavity in terms of resonance frequency, dielectric loading rate and various dielectric constant for different TEy and TMy modes is presented. This study includes two stage analysis procedures. Firstly, field expressions and resonance frequency of the dielectric loaded rectangular resonant cavity with respect to dielectric loading rate are obtained for different TEy and TMy modes by using semi-analytical approach. Secondly, perturbation method is applied for acquiring resonance frequency of each chosen different mode and dielectric constant with respect to dielectric loading rate. Comparison of two different method in terms of variation of resonant frequency with respect to relative dielectric thickness is performed for different dielectric loading case for the same mode and different modes for the same dielectric loading. The results show that perturbation approach can be good alternative to semi-analytical method to calculate the variation of the resonant frequency with respect to relative dielectric thickness.

Orijinal dilİngilizce
Ana bilgisayar yayını başlığı2017 4th International Electromagnetic Compatibility Conference, EMC Turkiye 2017
YayınlayanInstitute of Electrical and Electronics Engineers Inc.
ISBN (Elektronik)9781509048205
DOI'lar
Yayın durumuYayınlandı - 30 Eki 2017
Etkinlik4th International Electromagnetic Compatibility Conference, EMC Turkiye 2017 - Ankara, Türkiye
Süre: 24 Eyl 201727 Eyl 2017

Yayın serisi

Adı2017 4th International Electromagnetic Compatibility Conference, EMC Turkiye 2017

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???event.eventtypes.event.conference???4th International Electromagnetic Compatibility Conference, EMC Turkiye 2017
Ülke/BölgeTürkiye
ŞehirAnkara
Periyot24/09/1727/09/17

Bibliyografik not

Publisher Copyright:
© 2017 IEEE.

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