On the bit-error rate of binary phase shift keying over additive white generalized laplacian noise (AWGLN) channels

Ferkan Yilmaz; Mohamed Slim Alouini

doi:10.1109/SIU.2018.8404425

On the bit-error rate of binary phase shift keying over additive white generalized laplacian noise (AWGLN) channels

Ferkan Yilmaz
, Mohamed Slim Alouini

Araştırma sonucu: Kitap/Rapor/Konferans Bildirisinde Bölüm › Konferans katkısı › bilirkişi

2 Atıf (Scopus)

Özet

This paper considers a more general additive noise distribution, termed either as generalized Laplacian (GL) or McLeish distribution whose non-Gaussianity nature is parameterized to fit different impulsive noise environments, and analyzes the bit-error rate of binary phase shift keying modulation over additive white GL noise (AWGLN) channels in flat fading environments. Specifically, a closed-form expression is offered for the extended generalized-K fading environments, and accordingly, its simplifications for some special fading distributions and special additive noise models are presented. Finally, the mathematical formalism is illustrated by numerical examples, and verified by computer based simulations.

Orijinal dil	İngilizce
Ana bilgisayar yayını başlığı	26th IEEE Signal Processing and Communications Applications Conference, SIU 2018
Yayınlayan	Institute of Electrical and Electronics Engineers Inc.
Sayfalar	1-4
Sayfa sayısı	4
ISBN (Elektronik)	9781538615010
DOI'lar	https://doi.org/10.1109/SIU.2018.8404425
Yayın durumu	Yayınlandı - 5 Tem 2018
Harici olarak yayınlandı	Evet
Etkinlik	26th IEEE Signal Processing and Communications Applications Conference, SIU 2018 - Izmir, Turkey Süre: 2 May 2018 → 5 May 2018

Yayın serisi

Adı	26th IEEE Signal Processing and Communications Applications Conference, SIU 2018

???event.eventtypes.event.conference???

???event.eventtypes.event.conference???	26th IEEE Signal Processing and Communications Applications Conference, SIU 2018
Ülke/Bölge	Turkey
Şehir	Izmir
Periyot	2/05/18 → 5/05/18

Bibliyografik not

Publisher Copyright:
© 2018 IEEE.

Finansman

This work was supported partially by Yildiz Technical University (YTÜ) and partially by King Abdullah University of Science and Technology (KAUST).

Finansörler
YTÜ
King Abdullah University of Science and Technology
Yildiz Teknik Üniversitesi

Belgeye Erişim

10.1109/SIU.2018.8404425

Diğer Dosyalar ve Linkler

Link to publication in Scopus

Alıntı Yap

Yilmaz, F., & Alouini, M. S. (2018). On the bit-error rate of binary phase shift keying over additive white generalized laplacian noise (AWGLN) channels. In 26th IEEE Signal Processing and Communications Applications Conference, SIU 2018 (pp. 1-4). (26th IEEE Signal Processing and Communications Applications Conference, SIU 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SIU.2018.8404425

Yilmaz, Ferkan ; Alouini, Mohamed Slim. / On the bit-error rate of binary phase shift keying over additive white generalized laplacian noise (AWGLN) channels. 26th IEEE Signal Processing and Communications Applications Conference, SIU 2018. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 1-4 (26th IEEE Signal Processing and Communications Applications Conference, SIU 2018).

@inproceedings{8983b2c693824adca7ae977a449e54a9,

title = "On the bit-error rate of binary phase shift keying over additive white generalized laplacian noise (AWGLN) channels",

abstract = "This paper considers a more general additive noise distribution, termed either as generalized Laplacian (GL) or McLeish distribution whose non-Gaussianity nature is parameterized to fit different impulsive noise environments, and analyzes the bit-error rate of binary phase shift keying modulation over additive white GL noise (AWGLN) channels in flat fading environments. Specifically, a closed-form expression is offered for the extended generalized-K fading environments, and accordingly, its simplifications for some special fading distributions and special additive noise models are presented. Finally, the mathematical formalism is illustrated by numerical examples, and verified by computer based simulations.",

keywords = "Binary phase shift keying, Bit-error rate, Generalized Laplacian noise, Generalized composite fading channels, Non-Gaussian noise",

author = "Ferkan Yilmaz and Alouini, \{Mohamed Slim\}",

note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 26th IEEE Signal Processing and Communications Applications Conference, SIU 2018 ; Conference date: 02-05-2018 Through 05-05-2018",

year = "2018",

month = jul,

day = "5",

doi = "10.1109/SIU.2018.8404425",

language = "English",

series = "26th IEEE Signal Processing and Communications Applications Conference, SIU 2018",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "1--4",

booktitle = "26th IEEE Signal Processing and Communications Applications Conference, SIU 2018",

address = "United States",

}

Yilmaz, F & Alouini, MS 2018, On the bit-error rate of binary phase shift keying over additive white generalized laplacian noise (AWGLN) channels. in 26th IEEE Signal Processing and Communications Applications Conference, SIU 2018. 26th IEEE Signal Processing and Communications Applications Conference, SIU 2018, Institute of Electrical and Electronics Engineers Inc., pp. 1-4, 26th IEEE Signal Processing and Communications Applications Conference, SIU 2018, Izmir, Turkey, 2/05/18. https://doi.org/10.1109/SIU.2018.8404425

On the bit-error rate of binary phase shift keying over additive white generalized laplacian noise (AWGLN) channels. / Yilmaz, Ferkan; Alouini, Mohamed Slim.
26th IEEE Signal Processing and Communications Applications Conference, SIU 2018. Institute of Electrical and Electronics Engineers Inc., 2018. p. 1-4 (26th IEEE Signal Processing and Communications Applications Conference, SIU 2018).

Araştırma sonucu: Kitap/Rapor/Konferans Bildirisinde Bölüm › Konferans katkısı › bilirkişi

TY - GEN

T1 - On the bit-error rate of binary phase shift keying over additive white generalized laplacian noise (AWGLN) channels

AU - Yilmaz, Ferkan

AU - Alouini, Mohamed Slim

PY - 2018/7/5

Y1 - 2018/7/5

N2 - This paper considers a more general additive noise distribution, termed either as generalized Laplacian (GL) or McLeish distribution whose non-Gaussianity nature is parameterized to fit different impulsive noise environments, and analyzes the bit-error rate of binary phase shift keying modulation over additive white GL noise (AWGLN) channels in flat fading environments. Specifically, a closed-form expression is offered for the extended generalized-K fading environments, and accordingly, its simplifications for some special fading distributions and special additive noise models are presented. Finally, the mathematical formalism is illustrated by numerical examples, and verified by computer based simulations.

AB - This paper considers a more general additive noise distribution, termed either as generalized Laplacian (GL) or McLeish distribution whose non-Gaussianity nature is parameterized to fit different impulsive noise environments, and analyzes the bit-error rate of binary phase shift keying modulation over additive white GL noise (AWGLN) channels in flat fading environments. Specifically, a closed-form expression is offered for the extended generalized-K fading environments, and accordingly, its simplifications for some special fading distributions and special additive noise models are presented. Finally, the mathematical formalism is illustrated by numerical examples, and verified by computer based simulations.

KW - Binary phase shift keying

KW - Bit-error rate

KW - Generalized Laplacian noise

KW - Generalized composite fading channels

KW - Non-Gaussian noise

UR - https://www.scopus.com/pages/publications/85050829840

U2 - 10.1109/SIU.2018.8404425

DO - 10.1109/SIU.2018.8404425

M3 - Conference contribution

AN - SCOPUS:85050829840

T3 - 26th IEEE Signal Processing and Communications Applications Conference, SIU 2018

SP - 1

EP - 4

BT - 26th IEEE Signal Processing and Communications Applications Conference, SIU 2018

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 26th IEEE Signal Processing and Communications Applications Conference, SIU 2018

Y2 - 2 May 2018 through 5 May 2018

ER -

Yilmaz F, Alouini MS. On the bit-error rate of binary phase shift keying over additive white generalized laplacian noise (AWGLN) channels. In 26th IEEE Signal Processing and Communications Applications Conference, SIU 2018. Institute of Electrical and Electronics Engineers Inc. 2018. p. 1-4. (26th IEEE Signal Processing and Communications Applications Conference, SIU 2018). doi: 10.1109/SIU.2018.8404425

On the bit-error rate of binary phase shift keying over additive white generalized laplacian noise (AWGLN) channels

Özet

Yayın serisi

???event.eventtypes.event.conference???

Bibliyografik not

Finansman

Belgeye Erişim

Diğer Dosyalar ve Linkler

Parmak izi

Alıntı Yap