On the bit-error rate of binary phase shift keying over additive white generalized laplacian noise (AWGLN) channels

Ferkan Yilmaz, Mohamed Slim Alouini

Araştırma sonucu: ???type-name???Konferans katkısıbilirkişi

2 Atıf (Scopus)

Özet

This paper considers a more general additive noise distribution, termed either as generalized Laplacian (GL) or McLeish distribution whose non-Gaussianity nature is parameterized to fit different impulsive noise environments, and analyzes the bit-error rate of binary phase shift keying modulation over additive white GL noise (AWGLN) channels in flat fading environments. Specifically, a closed-form expression is offered for the extended generalized-K fading environments, and accordingly, its simplifications for some special fading distributions and special additive noise models are presented. Finally, the mathematical formalism is illustrated by numerical examples, and verified by computer based simulations.

Orijinal dilİngilizce
Ana bilgisayar yayını başlığı26th IEEE Signal Processing and Communications Applications Conference, SIU 2018
YayınlayanInstitute of Electrical and Electronics Engineers Inc.
Sayfalar1-4
Sayfa sayısı4
ISBN (Elektronik)9781538615010
DOI'lar
Yayın durumuYayınlandı - 5 Tem 2018
Harici olarak yayınlandıEvet
Etkinlik26th IEEE Signal Processing and Communications Applications Conference, SIU 2018 - Izmir, Turkey
Süre: 2 May 20185 May 2018

Yayın serisi

Adı26th IEEE Signal Processing and Communications Applications Conference, SIU 2018

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???event.eventtypes.event.conference???26th IEEE Signal Processing and Communications Applications Conference, SIU 2018
Ülke/BölgeTurkey
ŞehirIzmir
Periyot2/05/185/05/18

Bibliyografik not

Publisher Copyright:
© 2018 IEEE.

Finansman

This work was supported partially by Yildiz Technical University (YTÜ) and partially by King Abdullah University of Science and Technology (KAUST).

FinansörlerFinansör numarası
YTÜ
King Abdullah University of Science and Technology
Yildiz Teknik Üniversitesi

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