Özet
Object detection is one of the important tasks in many computer vision applications. Especially, in vision-guided robotics, numerous pattern matching algorithms are used for detecting and localizing randomly oriented objects in pick-and-place systems. Feature matching algorithms such as SIFT, SURF etc. are widely employed where geometric pattern matching algorithms often fail when objects lack contours and edges. Even though these algorithms give reliable results under extreme conditions of scene clutter and occlusion, they usually fail when there are multiple instances of same object and object shape deformation problems in the scene. In this paper, we present an approach which uses SURF feature sets consisting of local neighbor features for matching and hierarchical clustering for estimating object center. Using extracted local neighbor features and their descriptors, our algorithm finds more number of true-positive matches among features and improves the detection in the case of deformation and multiple instances. Experimental results show the effectiveness of the algorithm.
| Orijinal dil | İngilizce |
|---|---|
| Ana bilgisayar yayını başlığı | IEEE International Conference on Power, Control, Signals and Instrumentation Engineering, ICPCSI 2017 |
| Yayınlayan | Institute of Electrical and Electronics Engineers Inc. |
| Sayfalar | 185-189 |
| Sayfa sayısı | 5 |
| ISBN (Elektronik) | 9781538608135 |
| DOI'lar | |
| Yayın durumu | Yayınlandı - 20 Haz 2018 |
| Etkinlik | 2017 IEEE International Conference on Power, Control, Signals and Instrumentation Engineering, ICPCSI 2017 - Chennai, India Süre: 21 Eyl 2017 → 22 Eyl 2017 |
Yayın serisi
| Adı | IEEE International Conference on Power, Control, Signals and Instrumentation Engineering, ICPCSI 2017 |
|---|
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| ???event.eventtypes.event.conference??? | 2017 IEEE International Conference on Power, Control, Signals and Instrumentation Engineering, ICPCSI 2017 |
|---|---|
| Ülke/Bölge | India |
| Şehir | Chennai |
| Periyot | 21/09/17 → 22/09/17 |
Bibliyografik not
Publisher Copyright:© 2017 IEEE.
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