Non-topographic current contrast in scanning field emission microscopy

G. Bertolini; O. Gürlü; R. Pröbsting; D. Westholm; J. Wei; U. Ramsperger; D. A. Zanin; H. Cabrera; D. Pescia; J. P. Xanthakis; M. Schnedler; R. E. Dunin-Borkowski

doi:10.1098/rsos.210511

Non-topographic current contrast in scanning field emission microscopy

G. Bertolini, O. Gürlü, R. Pröbsting, D. Westholm, J. Wei, U. Ramsperger, D. A. Zanin, H. Cabrera, D. Pescia^*, J. P. Xanthakis, M. Schnedler, R. E. Dunin-Borkowski

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Araştırma sonucu: Dergiye katkı › Makale › bilirkişi

2 Atıf (Scopus)

Özet

In scanning field emission microscopy (SFEM), a tip (the source) is approached to few (or a few tens of) nanometres distance from a surface (the collector) and biased to field-emit electrons. In a previous study (Zanin et al. 2016 Proc. R. Soc. A 472, 20160475. (doi:10.1098/rspa.2016.0475)), the field-emitted current was found to change by approximately 1% at a monatomic surface step (approx. 200 pm thick). Here we prepare surface domains of adjacent different materials that, in some instances, have a topographic contrast smaller than 15 pm. Nevertheless, we observe a contrast in the field-emitted current as high as 10%. This non-topographic collector material dependence is a yet unexplored degree of freedom calling for a new understanding of the quantum mechanical tunnelling barrier at the source site that takes into account the properties of the material at the collector site.

Orijinal dil	İngilizce
Makale numarası	5009064
Dergi	Royal Society Open Science
Hacim	8
Basın numarası	7
DOI'lar	https://doi.org/10.1098/rsos.210511
Yayın durumu	Yayınlandı - Tem 2021
Harici olarak yayınlandı	Evet

Bibliyografik not

Publisher Copyright:
© 2021 The Authors.

Finansman

Data accessibility. The ad hoc software used to analyse the images is available at Zenodo: https://zenodo.org/record/ 3675444#.YOMsNn7TWUk [33]. All data required to support the conclusions of the presented research are contained in the included figures. Authors’ contributions. G.B., O.G. and R.P. did the experiments reported in figures 2, 3, 4b, 4d, 6, 7, 8, 9, 10 and 12. D.W, J.W. and U.R. did the experiments reported in figures 4a, 4c and 11. D.A.Z. and U.R. built the instruments used in this work. H.C. discussed the paper. M.S. did the simulations reported in figure 5. M.S., J.P.X. and R.E.D.-B. provided the theoretical input and discussed the paper. D.P. wrote the paper. Competing interests. We declare we have no competing interests. Funding. The research was partially funded by Marie Curie Initial Training Network (ITN), grant no. 606988 under FP7-PEOPLE-2013-ITN, the Swiss National Science Foundation (SNF grant no. 20-134422) and the Commission for Technology and Innovation (CTI grant no. 9860.1 PFNM-NM). Acknowledgements. O.G. thanks M. Erbudak and E. Tosatti. D.P. thanks A. Kyritsakis and C. Walker for helpful discussions. D.P., G.B., J.W., D.W. and U.R. thank R. Forbes for helpful discussions.

Finansörler	Finansör numarası
Seventh Framework Programme	606988
Marie Curie	FP7-PEOPLE-2013-ITN
Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung	20-134422
Kommission für Technologie und Innovation	9860.1 PFNM-NM

Belgeye Erişim

10.1098/rsos.210511

Diğer Dosyalar ve Linkler

Link to publication in Scopus

Alıntı Yap

@article{78380998585c45ffb189d97d5cad6ca5,

title = "Non-topographic current contrast in scanning field emission microscopy",

abstract = "In scanning field emission microscopy (SFEM), a tip (the source) is approached to few (or a few tens of) nanometres distance from a surface (the collector) and biased to field-emit electrons. In a previous study (Zanin et al. 2016 Proc. R. Soc. A 472, 20160475. (doi:10.1098/rspa.2016.0475)), the field-emitted current was found to change by approximately 1% at a monatomic surface step (approx. 200 pm thick). Here we prepare surface domains of adjacent different materials that, in some instances, have a topographic contrast smaller than 15 pm. Nevertheless, we observe a contrast in the field-emitted current as high as 10%. This non-topographic collector material dependence is a yet unexplored degree of freedom calling for a new understanding of the quantum mechanical tunnelling barrier at the source site that takes into account the properties of the material at the collector site.",

keywords = "current-voltage characteristics, field emission, scanning tunnelling microscopy, surface imaging",

author = "G. Bertolini and O. G{\"u}rl{\"u} and R. Pr{\"o}bsting and D. Westholm and J. Wei and U. Ramsperger and Zanin, {D. A.} and H. Cabrera and D. Pescia and Xanthakis, {J. P.} and M. Schnedler and Dunin-Borkowski, {R. E.}",

note = "Publisher Copyright: {\textcopyright} 2021 The Authors.",

year = "2021",

month = jul,

doi = "10.1098/rsos.210511",

language = "English",

volume = "8",

journal = "Royal Society Open Science",

issn = "2054-5703",

publisher = "The Royal Society",

number = "7",

}

TY - JOUR

T1 - Non-topographic current contrast in scanning field emission microscopy

AU - Bertolini, G.

AU - Gürlü, O.

AU - Pröbsting, R.

AU - Westholm, D.

AU - Wei, J.

AU - Ramsperger, U.

AU - Zanin, D. A.

AU - Cabrera, H.

AU - Pescia, D.

AU - Xanthakis, J. P.

AU - Schnedler, M.

AU - Dunin-Borkowski, R. E.

PY - 2021/7

Y1 - 2021/7

N2 - In scanning field emission microscopy (SFEM), a tip (the source) is approached to few (or a few tens of) nanometres distance from a surface (the collector) and biased to field-emit electrons. In a previous study (Zanin et al. 2016 Proc. R. Soc. A 472, 20160475. (doi:10.1098/rspa.2016.0475)), the field-emitted current was found to change by approximately 1% at a monatomic surface step (approx. 200 pm thick). Here we prepare surface domains of adjacent different materials that, in some instances, have a topographic contrast smaller than 15 pm. Nevertheless, we observe a contrast in the field-emitted current as high as 10%. This non-topographic collector material dependence is a yet unexplored degree of freedom calling for a new understanding of the quantum mechanical tunnelling barrier at the source site that takes into account the properties of the material at the collector site.

AB - In scanning field emission microscopy (SFEM), a tip (the source) is approached to few (or a few tens of) nanometres distance from a surface (the collector) and biased to field-emit electrons. In a previous study (Zanin et al. 2016 Proc. R. Soc. A 472, 20160475. (doi:10.1098/rspa.2016.0475)), the field-emitted current was found to change by approximately 1% at a monatomic surface step (approx. 200 pm thick). Here we prepare surface domains of adjacent different materials that, in some instances, have a topographic contrast smaller than 15 pm. Nevertheless, we observe a contrast in the field-emitted current as high as 10%. This non-topographic collector material dependence is a yet unexplored degree of freedom calling for a new understanding of the quantum mechanical tunnelling barrier at the source site that takes into account the properties of the material at the collector site.

KW - current-voltage characteristics

KW - field emission

KW - scanning tunnelling microscopy

KW - surface imaging

UR - http://www.scopus.com/inward/record.url?scp=85113256322&partnerID=8YFLogxK

U2 - 10.1098/rsos.210511

DO - 10.1098/rsos.210511

M3 - Article

AN - SCOPUS:85113256322

SN - 2054-5703

VL - 8

JO - Royal Society Open Science

JF - Royal Society Open Science

IS - 7

M1 - 5009064

ER -

Non-topographic current contrast in scanning field emission microscopy

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