Non-topographic contrast in constant-current Scanning Field-Emission Microscopy (SFEM)

D. Westholm; J. Wei; G. Bertolini; O. Gurlu; D. Pescia; U. Ramsperger

doi:10.1109/IVNC49440.2020.9203360

Non-topographic contrast in constant-current Scanning Field-Emission Microscopy (SFEM)

D. Westholm
, J. Wei
, G. Bertolini
, O. Gurlu
, D. Pescia
, U. Ramsperger^*

^*Bu çalışma için yazışmadan sorumlu yazar

Swiss Federal Institute of Technology Zurich

Araştırma çıktısı: Kitap/Rapor/Konferans Bildirisinde Bölüm › Konferans katkısı › Hakem

1 Atıf (Scopus)

Özet

Scanning Tunneling Microscopy is performed in the conventional (tunneling) and in the field-emission regime. Images of W(110)-surfaces with and without some carbon content are taken in the constant current mode, in which the tip-target vertical distance displaces to compensate for the changes of the tunneling, respectively, field emission current. In the field emission regime, we observe tip-target displacements that are not related to the topographic contrast.

Orijinal dil	İngilizce
Ana bilgisayar yayını başlığı	33rd International Vacuum Nanoelectronics Conference, IVNC 2020
Yayınlayan	Institute of Electrical and Electronics Engineers Inc.
ISBN (Elektronik)	9781728194547
DOI'lar	https://doi.org/10.1109/IVNC49440.2020.9203360
Yayın durumu	Yayınlandı - Tem 2020
Harici olarak yayınlandı	Evet
Etkinlik	33rd International Vacuum Nanoelectronics Conference, IVNC 2020 - Virtual, Lyon, France Süre: 6 Tem 2020 → 7 Tem 2020

Yayın serisi

Adı	33rd International Vacuum Nanoelectronics Conference, IVNC 2020

???event.eventtypes.event.conference???

???event.eventtypes.event.conference???	33rd International Vacuum Nanoelectronics Conference, IVNC 2020
Ülke/Bölge	France
Şehir	Virtual, Lyon
Periyot	6/07/20 → 7/07/20

Bibliyografik not

Publisher Copyright:
© 2020 IEEE.

Finansman

ACKNOWLEDGMENT We thank the European Commission (SIMDALEE2: Marie Curie Initial Training Network (ITN), Grant number 606988 under FP7-PEOPLE-2013-ITN, the Swiss National Science Foundation (SNF grant number 20-134422) and the Commission for Technology and Innovation (CTI grant number 9860.1 PFNM-NM) for financial support.

Finansörler	Finansör numarası
Seventh Framework Programme	606988
European Commission	FP7-PEOPLE-2013-ITN
Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung	20-134422
Kommission für Technologie und Innovation	9860.1 PFNM-NM

Belgeye Erişim

10.1109/IVNC49440.2020.9203360

Diğer Dosyalar ve Linkler

Link to publication in Scopus

Alıntı Yap

Westholm, D., Wei, J., Bertolini, G., Gurlu, O., Pescia, D., & Ramsperger, U. (2020). Non-topographic contrast in constant-current Scanning Field-Emission Microscopy (SFEM). In 33rd International Vacuum Nanoelectronics Conference, IVNC 2020 Makale 9203360 (33rd International Vacuum Nanoelectronics Conference, IVNC 2020). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IVNC49440.2020.9203360

@inproceedings{59c127539ed44165a42b017780b34cec,

title = "Non-topographic contrast in constant-current Scanning Field-Emission Microscopy (SFEM)",

abstract = "Scanning Tunneling Microscopy is performed in the conventional (tunneling) and in the field-emission regime. Images of W(110)-surfaces with and without some carbon content are taken in the constant current mode, in which the tip-target vertical distance displaces to compensate for the changes of the tunneling, respectively, field emission current. In the field emission regime, we observe tip-target displacements that are not related to the topographic contrast.",

keywords = "Contact potential, Field Emission, Low Energy Electron microscopy, Scanning Tunneling Microscopy",

author = "D. Westholm and J. Wei and G. Bertolini and O. Gurlu and D. Pescia and U. Ramsperger",

note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; 33rd International Vacuum Nanoelectronics Conference, IVNC 2020 ; Conference date: 06-07-2020 Through 07-07-2020",

year = "2020",

month = jul,

doi = "10.1109/IVNC49440.2020.9203360",

language = "English",

series = "33rd International Vacuum Nanoelectronics Conference, IVNC 2020",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "33rd International Vacuum Nanoelectronics Conference, IVNC 2020",

address = "United States",

}

Westholm, D, Wei, J, Bertolini, G, Gurlu, O, Pescia, D & Ramsperger, U 2020, Non-topographic contrast in constant-current Scanning Field-Emission Microscopy (SFEM). in 33rd International Vacuum Nanoelectronics Conference, IVNC 2020., 9203360, 33rd International Vacuum Nanoelectronics Conference, IVNC 2020, Institute of Electrical and Electronics Engineers Inc., 33rd International Vacuum Nanoelectronics Conference, IVNC 2020, Virtual, Lyon, France, 6/07/20. https://doi.org/10.1109/IVNC49440.2020.9203360

Non-topographic contrast in constant-current Scanning Field-Emission Microscopy (SFEM). / Westholm, D.; Wei, J.; Bertolini, G. et al.
33rd International Vacuum Nanoelectronics Conference, IVNC 2020. Institute of Electrical and Electronics Engineers Inc., 2020. 9203360 (33rd International Vacuum Nanoelectronics Conference, IVNC 2020).

Araştırma çıktısı: Kitap/Rapor/Konferans Bildirisinde Bölüm › Konferans katkısı › Hakem

TY - GEN

T1 - Non-topographic contrast in constant-current Scanning Field-Emission Microscopy (SFEM)

AU - Westholm, D.

AU - Wei, J.

AU - Bertolini, G.

AU - Gurlu, O.

AU - Pescia, D.

AU - Ramsperger, U.

PY - 2020/7

Y1 - 2020/7

N2 - Scanning Tunneling Microscopy is performed in the conventional (tunneling) and in the field-emission regime. Images of W(110)-surfaces with and without some carbon content are taken in the constant current mode, in which the tip-target vertical distance displaces to compensate for the changes of the tunneling, respectively, field emission current. In the field emission regime, we observe tip-target displacements that are not related to the topographic contrast.

AB - Scanning Tunneling Microscopy is performed in the conventional (tunneling) and in the field-emission regime. Images of W(110)-surfaces with and without some carbon content are taken in the constant current mode, in which the tip-target vertical distance displaces to compensate for the changes of the tunneling, respectively, field emission current. In the field emission regime, we observe tip-target displacements that are not related to the topographic contrast.

KW - Contact potential

KW - Field Emission

KW - Low Energy Electron microscopy

KW - Scanning Tunneling Microscopy

UR - https://www.scopus.com/pages/publications/85092702849

U2 - 10.1109/IVNC49440.2020.9203360

DO - 10.1109/IVNC49440.2020.9203360

M3 - Conference contribution

AN - SCOPUS:85092702849

T3 - 33rd International Vacuum Nanoelectronics Conference, IVNC 2020

BT - 33rd International Vacuum Nanoelectronics Conference, IVNC 2020

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 33rd International Vacuum Nanoelectronics Conference, IVNC 2020

Y2 - 6 July 2020 through 7 July 2020

ER -

Westholm D, Wei J, Bertolini G, Gurlu O, Pescia D, Ramsperger U. Non-topographic contrast in constant-current Scanning Field-Emission Microscopy (SFEM). In 33rd International Vacuum Nanoelectronics Conference, IVNC 2020. Institute of Electrical and Electronics Engineers Inc. 2020. 9203360. (33rd International Vacuum Nanoelectronics Conference, IVNC 2020). doi: 10.1109/IVNC49440.2020.9203360

Non-topographic contrast in constant-current Scanning Field-Emission Microscopy (SFEM)

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Bibliyografik not

Finansman

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