Modeling the Avalanche Breakdown of the FMMT417 NPN BJT in the TINA Environment

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Özet

In this paper, the avalanche breakdown observed in avalanche-type bipolar junction transistors is modeled, where a macromodel proposed earlier in the literature is extended to become compatible with practical circuit simulators. Moreover, contributions to the macromodel are introduced and implemented. The resulting model is used in circuit simulations, and the outcomes are compared with the experimental results that depict the accuracy of the proposed approach.

Orijinal dilİngilizce
Ana bilgisayar yayını başlığıProceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023
YayınlayanInstitute of Electrical and Electronics Engineers Inc.
ISBN (Elektronik)9798350332650
DOI'lar
Yayın durumuYayınlandı - 2023
Etkinlik19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023 - Funchal, Portugal
Süre: 3 Tem 20235 Tem 2023

Yayın serisi

AdıProceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023

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???event.eventtypes.event.conference???19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023
Ülke/BölgePortugal
ŞehirFunchal
Periyot3/07/235/07/23

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Publisher Copyright:
© 2023 IEEE.

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