Özet
In this paper, the avalanche breakdown observed in avalanche-type bipolar junction transistors is modeled, where a macromodel proposed earlier in the literature is extended to become compatible with practical circuit simulators. Moreover, contributions to the macromodel are introduced and implemented. The resulting model is used in circuit simulations, and the outcomes are compared with the experimental results that depict the accuracy of the proposed approach.
Orijinal dil | İngilizce |
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Ana bilgisayar yayını başlığı | Proceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023 |
Yayınlayan | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Elektronik) | 9798350332650 |
DOI'lar | |
Yayın durumu | Yayınlandı - 2023 |
Etkinlik | 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023 - Funchal, Portugal Süre: 3 Tem 2023 → 5 Tem 2023 |
Yayın serisi
Adı | Proceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023 |
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???event.eventtypes.event.conference??? | 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023 |
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Ülke/Bölge | Portugal |
Şehir | Funchal |
Periyot | 3/07/23 → 5/07/23 |
Bibliyografik not
Publisher Copyright:© 2023 IEEE.