Micro-simulation based ramp metering on istanbul freeways: An evaluation adopting ALINEA

Ismail M. Abuamer, Mehmet Ali Silgu, Hilmi Berk Celikoglu

Araştırma sonucu: ???type-name???Konferans katkısıbilirkişi

34 Atıf (Scopus)

Özet

Congestion on freeways restrains its ability to provide smooth traffic flow. Normally congestion occurs when traffic volumes are considerably greater than the link capacity especially in the peak hours or in case of incidents that disturb the traffic flow, which either are denoted as recurrent and nonrecurrent congestion respectively. As a consequence, the freeway network performance is adversely affected in terms of reducing the speed, increasing the crash probability, increasing the travel time and increasing the vehicle emissions due to increase the fuel consumption. Since the structural solution is limited to many factors, ramp metering strategies have played a major role in freeways' traffic management systems. In the purpose of evaluating the effects of ramp control approach on congested flow at Istanbul freeways we summarize in the present paper the analyses conducted over a microscopic simulation-based environment where a local ramp metering strategy, ALINEA, is utilized online by integrating VISSIM and MATLAB.

Orijinal dilİngilizce
Ana bilgisayar yayını başlığı2016 IEEE 19th International Conference on Intelligent Transportation Systems, ITSC 2016
YayınlayanInstitute of Electrical and Electronics Engineers Inc.
Sayfalar695-700
Sayfa sayısı6
ISBN (Elektronik)9781509018895
DOI'lar
Yayın durumuYayınlandı - 22 Ara 2016
Etkinlik19th IEEE International Conference on Intelligent Transportation Systems, ITSC 2016 - Rio de Janeiro, Brazil
Süre: 1 Kas 20164 Kas 2016

Yayın serisi

AdıIEEE Conference on Intelligent Transportation Systems, Proceedings, ITSC

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???event.eventtypes.event.conference???19th IEEE International Conference on Intelligent Transportation Systems, ITSC 2016
Ülke/BölgeBrazil
ŞehirRio de Janeiro
Periyot1/11/164/11/16

Bibliyografik not

Publisher Copyright:
© 2016 IEEE.

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