Özet
Developing a retail product recognition system presents different challenges compared to traditional object recognition systems. Retail products contain classes that are very similar to each other but differ in small details. The current product classes in the system must be frequently expanded with new product classes or updated with packaging changes. For these reasons, we developed a metric learning-based product recognition system that provides superior product recognition performance and the ability to add new products and update existing ones. The key components of our system are the ConvNext-nano feature extractor, ArcFace loss, feature vector database, similarity search, and clustering algorithm. Through tests performed on a custom dataset consisting of 775,000 samples from 994 classes, we achieved an accuracy of 93.7% in product recognition and an average clustering accuracy of 67.58% in discovering new products.
| Tercüme edilen katkı başlığı | A Metric Learning Based System for Retail Product Recognition and Novel Class Discovery |
|---|---|
| Orijinal dil | Türkçe |
| Ana bilgisayar yayını başlığı | 31st IEEE Conference on Signal Processing and Communications Applications, SIU 2023 |
| Yayınlayan | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Elektronik) | 9798350343557 |
| DOI'lar | |
| Yayın durumu | Yayınlandı - 2023 |
| Etkinlik | 31st IEEE Conference on Signal Processing and Communications Applications, SIU 2023 - Istanbul, Turkey Süre: 5 Tem 2023 → 8 Tem 2023 |
Yayın serisi
| Adı | 31st IEEE Conference on Signal Processing and Communications Applications, SIU 2023 |
|---|
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| ???event.eventtypes.event.conference??? | 31st IEEE Conference on Signal Processing and Communications Applications, SIU 2023 |
|---|---|
| Ülke/Bölge | Turkey |
| Şehir | Istanbul |
| Periyot | 5/07/23 → 8/07/23 |
Bibliyografik not
Publisher Copyright:© 2023 IEEE.
Keywords
- metric learning
- novel class discovery
- retail
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