Magnetic Properties of Silicon Doped with Impurity Atoms of Europium

N. F. Zikrillaev; G. H. Mavlonov; L. Trabzon; S. B. Isamov; Y. A. Abduganiev; Sh N. Ibodullaev; G. A. Kushiev

doi:10.21272/jnep.15(6).06001

Magnetic Properties of Silicon Doped with Impurity Atoms of Europium

N. F. Zikrillaev, G. H. Mavlonov, L. Trabzon, S. B. Isamov, Y. A. Abduganiev, Sh N. Ibodullaev, G. A. Kushiev

Makina Mühendisliği Bölümü

Tashkent State Technical University

Araştırma sonucu: ???type-name??? › Makale › bilirkişi

2 Atıf (Scopus)

Özet

The electrical parameters of silicon samples diffusion doped by europium impurity atoms were studied by Van der Pauw (VDP) method. The experimental results were examined, particularly the surface morphology using an Atomic Force Microscope (AFM). The lattice constant of the materials was calculated with the help of Bragg-Brentano's law using X-ray diffraction on the XRD pattern of the Si<P,Eu> sample.

Orijinal dil	İngilizce
Makale numarası	06001
Dergi	Journal of Nano- and Electronic Physics
Hacim	15
Basın numarası	6
DOI'lar	https://doi.org/10.21272/jnep.15(6).06001
Yayın durumu	Yayınlandı - 2023

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© 2023 Sumy State University. All Rights Reserved.

Belgeye Erişim

10.21272/jnep.15(6).06001

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Link to publication in Scopus

Alıntı Yap

@article{bc47ec7f3dfd4749b05c12e5f5c084bc,

title = "Magnetic Properties of Silicon Doped with Impurity Atoms of Europium",

abstract = "The electrical parameters of silicon samples diffusion doped by europium impurity atoms were studied by Van der Pauw (VDP) method. The experimental results were examined, particularly the surface morphology using an Atomic Force Microscope (AFM). The lattice constant of the materials was calculated with the help of Bragg-Brentano's law using X-ray diffraction on the XRD pattern of the Si sample.",

keywords = "AFM, Bragg angle, Bragg-Brentano, Lattice constant, Miller index, X-rays, XRD",

author = "Zikrillaev, {N. F.} and Mavlonov, {G. H.} and L. Trabzon and Isamov, {S. B.} and Abduganiev, {Y. A.} and Ibodullaev, {Sh N.} and Kushiev, {G. A.}",

year = "2023",

doi = "10.21272/jnep.15(6).06001",

language = "English",

volume = "15",

journal = "Journal of Nano- and Electronic Physics",

issn = "2077-6772",

publisher = "Sumy State University",

number = "6",

}

TY - JOUR

T1 - Magnetic Properties of Silicon Doped with Impurity Atoms of Europium

AU - Zikrillaev, N. F.

AU - Mavlonov, G. H.

AU - Trabzon, L.

AU - Isamov, S. B.

AU - Abduganiev, Y. A.

AU - Ibodullaev, Sh N.

AU - Kushiev, G. A.

PY - 2023

Y1 - 2023

N2 - The electrical parameters of silicon samples diffusion doped by europium impurity atoms were studied by Van der Pauw (VDP) method. The experimental results were examined, particularly the surface morphology using an Atomic Force Microscope (AFM). The lattice constant of the materials was calculated with the help of Bragg-Brentano's law using X-ray diffraction on the XRD pattern of the Si sample.

AB - The electrical parameters of silicon samples diffusion doped by europium impurity atoms were studied by Van der Pauw (VDP) method. The experimental results were examined, particularly the surface morphology using an Atomic Force Microscope (AFM). The lattice constant of the materials was calculated with the help of Bragg-Brentano's law using X-ray diffraction on the XRD pattern of the Si sample.

KW - AFM

KW - Bragg angle

KW - Bragg-Brentano

KW - Lattice constant

KW - Miller index

KW - X-rays

KW - XRD

UR - http://www.scopus.com/inward/record.url?scp=85184765741&partnerID=8YFLogxK

U2 - 10.21272/jnep.15(6).06001

DO - 10.21272/jnep.15(6).06001

M3 - Article

AN - SCOPUS:85184765741

SN - 2077-6772

VL - 15

JO - Journal of Nano- and Electronic Physics

JF - Journal of Nano- and Electronic Physics

IS - 6

M1 - 06001

ER -

Magnetic Properties of Silicon Doped with Impurity Atoms of Europium

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Belgeye Erişim

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