@inproceedings{c928bfbf2e5242b287d352a2bfe67c69,
title = "Linear measurements of nanomechanical phenomena using small-amplitude AFM",
abstract = "Dynamic Atomic Force Microscopy (AFM) is typically performed at amplitudes that are quite large compared to the measured interaction range. This complicates the data interpretation as measurements become highly non-linear. A new dynamic AFM technique in which ultra-small amplitudes are used (as low as 0.15 Angstrom) is able to linearize measurements of nanomechanical phenomena in ultra-high vacuum (UHV) and in liquids. Using this new technique we have measured single atom bonding, atomic-scale dissipation and molecular ordering in liquid layers, including water.",
author = "Hoffmann, \{Peter M.\} and Shivprasad Patil and George Matei and Atay Tanulku and Ralph Grimble and {\"O}zgur {\"O}zer and Steve Jeffery and Ahmet Oral and John Pethica",
year = "2004",
doi = "10.1557/proc-838-o1.8",
language = "English",
isbn = "1558997865",
series = "Materials Research Society Symposium Proceedings",
publisher = "Materials Research Society",
pages = "7--12",
booktitle = "Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials",
note = "2004 MRS Fall Meeting ; Conference date: 29-11-2004 Through 03-12-2004",
}