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Investigation of the effect of thickness, taper ratio and aspect ratio on fin flutter velocity of a model rocket using response surface method

  • Istanbul Technical University

Araştırma çıktısı: Kitap/Rapor/Konferans Bildirisinde BölümKonferans katkısıHakem

4 Atıf (Scopus)

Özet

The main focus of this study is to examine the effect of thickness, taper ratio and aspect ratio on the fin flutter speed of a model rocket using response surface method. The most effective geometric parameter on fin flutter is determined. Coupled effects of these parameters are also analyzed within the content of the study. Additionally, a response surface representing the flutter velocity behavior is also determined. Modal analysis of different fin geometries having the same planform area have been performed using a FEA solver and the variation of the natural frequencies under the suitable boundary conditions are examined. Then, flutter analysis are performed using an aeroelastic solver based on the results of the modal analysis. As a result, taking the advantage of response surface method, the effect of thickness, taper ratio, aspect ratio and also the combined effects of these parameters on flutter speed is presented.

Orijinal dilİngilizce
Ana bilgisayar yayını başlığıRAST 2015 - Proceedings of 7th International Conference on Recent Advances in Space Technologies
EditörlerM. Fevzi Unal, Suleyman Basturk, Okyay Kaynak, Abdurrahman Hacioglu, Fuat Ince
YayınlayanInstitute of Electrical and Electronics Engineers Inc.
Sayfalar27-32
Sayfa sayısı6
ISBN (Elektronik)9781467377607
DOI'lar
Yayın durumuYayınlandı - 17 Ağu 2015
Etkinlik7th International Conference on Recent Advances in Space Technologies, RAST 2015 - Istanbul, Türkiye
Süre: 16 Haz 201519 Haz 2015

Yayın serisi

AdıRAST 2015 - Proceedings of 7th International Conference on Recent Advances in Space Technologies

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???event.eventtypes.event.conference???7th International Conference on Recent Advances in Space Technologies, RAST 2015
Ülke/BölgeTürkiye
ŞehirIstanbul
Periyot16/06/1519/06/15

Bibliyografik not

Publisher Copyright:
© 2015 IEEE.

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