Özet
The influence of lattice mismatch-induced tensile strain on the diffusion of Si dimers on Si(001) has been studied. The rate of surface diffusion of a Si dimer along the substrate dimer rows is relatively insensitive to tensile strain, whereas the rate of diffusion for a Si dimer across the substrate dimer rows is significantly enhanced. The insensitivity of the along row diffusion rate for tensile strain is attributed to the presence of a dissociative intermediate state of the ad-dimer during diffusion rather than diffusion as a solid unit.
| Orijinal dil | İngilizce |
|---|---|
| Sayfa (başlangıç-bitiş) | 247-252 |
| Sayfa sayısı | 6 |
| Dergi | Surface Science |
| Hacim | 452 |
| Basın numarası | 1-3 |
| DOI'lar | |
| Yayın durumu | Yayınlandı - 1 May 2000 |
| Harici olarak yayınlandı | Evet |
Finansman
This work is supported by the Netherlands Organization for Scientific Research (NWO).
| Finansörler |
|---|
| Netherlands Organization for Scientific Research |
| Nederlandse Organisatie voor Wetenschappelijk Onderzoek |
Parmak izi
Influence of strain on the diffusion of Si dimers on Si(001)' araştırma başlıklarına git. Birlikte benzersiz bir parmak izi oluştururlar.Alıntı Yap
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