In situ synchrotron measurements of oxide growth strains

Jonathan D. Almer*, Geoffrey A. Swift, John A. Nychka, Ersan Üstündag, David R. Clarke

*Bu çalışma için yazışmadan sorumlu yazar

Araştırma sonucu: ???type-name???Konferans katkısıbilirkişi

5 Atıf (Scopus)

Özet

Synchrotron x-rays are used for in situ determination of oxide strain, during oxide formation on a Kanthal Al FeCrAlZr substrate at 1160°C. The measurements rely on use of high-energy (∼80keV) xrays and transmission geometry, and the methodology of the strain measurements is presented. Oxide growth strains at elevated temperature, relative to pure alumina, were seen to be small, while temperature excursions induced significant strains. Furthermore, significant strain relaxation was observed during isothermal holds, suggesting oxide creep as a major relaxation mechanism. Upon cooling to room temperature, significant residual strains developed, with a corresponding in-plane residual stress of-3.7 GPa.

Orijinal dilİngilizce
Ana bilgisayar yayını başlığıResidual Stresses VII, ICRS 7 - Proceedings of the 7th International Conference on Residual Stresses, ICRS-7
YayınlayanTrans Tech Publications Ltd
Sayfalar287-293
Sayfa sayısı7
ISBN (Basılı)0878499695, 9780878499694
DOI'lar
Yayın durumuYayınlandı - 2005
Harici olarak yayınlandıEvet
Etkinlik7th International Conference on Residual Stresses, ICRS-7 - Xi'an, China
Süre: 14 Haz 200417 Haz 2004

Yayın serisi

AdıMaterials Science Forum
Hacim490-491
ISSN (Basılı)0255-5476
ISSN (Elektronik)1662-9752

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???event.eventtypes.event.conference???7th International Conference on Residual Stresses, ICRS-7
Ülke/BölgeChina
ŞehirXi'an
Periyot14/06/0417/06/04

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