TY - GEN
T1 - In situ synchrotron measurements of oxide growth strains
AU - Almer, Jonathan D.
AU - Swift, Geoffrey A.
AU - Nychka, John A.
AU - Üstündag, Ersan
AU - Clarke, David R.
PY - 2005
Y1 - 2005
N2 - Synchrotron x-rays are used for in situ determination of oxide strain, during oxide formation on a Kanthal Al FeCrAlZr substrate at 1160°C. The measurements rely on use of high-energy (∼80keV) xrays and transmission geometry, and the methodology of the strain measurements is presented. Oxide growth strains at elevated temperature, relative to pure alumina, were seen to be small, while temperature excursions induced significant strains. Furthermore, significant strain relaxation was observed during isothermal holds, suggesting oxide creep as a major relaxation mechanism. Upon cooling to room temperature, significant residual strains developed, with a corresponding in-plane residual stress of-3.7 GPa.
AB - Synchrotron x-rays are used for in situ determination of oxide strain, during oxide formation on a Kanthal Al FeCrAlZr substrate at 1160°C. The measurements rely on use of high-energy (∼80keV) xrays and transmission geometry, and the methodology of the strain measurements is presented. Oxide growth strains at elevated temperature, relative to pure alumina, were seen to be small, while temperature excursions induced significant strains. Furthermore, significant strain relaxation was observed during isothermal holds, suggesting oxide creep as a major relaxation mechanism. Upon cooling to room temperature, significant residual strains developed, with a corresponding in-plane residual stress of-3.7 GPa.
UR - http://www.scopus.com/inward/record.url?scp=35148818261&partnerID=8YFLogxK
U2 - 10.4028/0-87849-969-5.287
DO - 10.4028/0-87849-969-5.287
M3 - Conference contribution
AN - SCOPUS:35148818261
SN - 0878499695
SN - 9780878499694
T3 - Materials Science Forum
SP - 287
EP - 293
BT - Residual Stresses VII, ICRS 7 - Proceedings of the 7th International Conference on Residual Stresses, ICRS-7
PB - Trans Tech Publications Ltd
T2 - 7th International Conference on Residual Stresses, ICRS-7
Y2 - 14 June 2004 through 17 June 2004
ER -