In situ hot-stage ESEM evaluation of CeO₂ buffer layers on Ni tapes for YBCO coated conductors

CeO₂ coatings have been prepared on Ni tapes from solutions derived from Ce-based precursors using a sol-gel method for YBCO coated conductors. The surface morphology and structure of coatings were characterized using in situ Hot-Stage Environmental Scanning Electron Microscope (ESEM) and X-ray diffraction (XRD). Crack size and crack propagation rate of these coatings were determined using in situ Hot-Stage ESEM depending on temperature at certain time. It has been found that the size and propagation rate of cracks of these coatings increased with increasing process temperature.