High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (ne AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy

A. Oral; R. A. Grimble; H. Ö Özer; J. B. Pethica

doi:10.1063/1.1593786

High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (ne AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy

A. Oral^*, R. A. Grimble, H. Ö Özer, J. B. Pethica

^*Bu çalışma için yazışmadan sorumlu yazar

Araştırma sonucu: Dergiye katkı › Makale › bilirkişi

43 Atıf (Scopus)

Özet

A highly sensitive noncontact atomic force microscope/scanning tunneling microscope (STM) operating in ultrahigh vacuum (UHV) with subangstrom oscillation amplitudes for atomic resolution imaging and force-distance spectroscopy was described. A novel fiber interferometer with very low noise levels was employed to detect cantilever displacements. The subangstrom oscillation amplitudes allow the force-distance measurements which reveal very short range force interactions.

Orijinal dil	İngilizce
Sayfa (başlangıç-bitiş)	3656-3663
Sayfa sayısı	8
Dergi	Review of Scientific Instruments
Hacim	74
Basın numarası	8
DOI'lar	https://doi.org/10.1063/1.1593786
Yayın durumu	Yayınlandı - Ağu 2003
Harici olarak yayınlandı	Evet

Belgeye Erişim

10.1063/1.1593786

Diğer Dosyalar ve Linkler

Link to publication in Scopus

Alıntı Yap

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abstract = "A highly sensitive noncontact atomic force microscope/scanning tunneling microscope (STM) operating in ultrahigh vacuum (UHV) with subangstrom oscillation amplitudes for atomic resolution imaging and force-distance spectroscopy was described. A novel fiber interferometer with very low noise levels was employed to detect cantilever displacements. The subangstrom oscillation amplitudes allow the force-distance measurements which reveal very short range force interactions.",

author = "A. Oral and Grimble, {R. A.} and {\"O}zer, {H. {\"O}} and Pethica, {J. B.}",

year = "2003",

month = aug,

doi = "10.1063/1.1593786",

language = "English",

volume = "74",

pages = "3656--3663",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics",

number = "8",

}

High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (ne AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy. / Oral, A.; Grimble, R. A.; Özer, H. Ö et al.
In: Review of Scientific Instruments, Hac. 74, No. 8, 08.2003, p. 3656-3663.

Araştırma sonucu: Dergiye katkı › Makale › bilirkişi

TY - JOUR

T1 - High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (ne AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy

AU - Oral, A.

AU - Grimble, R. A.

AU - Özer, H. Ö

AU - Pethica, J. B.

PY - 2003/8

Y1 - 2003/8

N2 - A highly sensitive noncontact atomic force microscope/scanning tunneling microscope (STM) operating in ultrahigh vacuum (UHV) with subangstrom oscillation amplitudes for atomic resolution imaging and force-distance spectroscopy was described. A novel fiber interferometer with very low noise levels was employed to detect cantilever displacements. The subangstrom oscillation amplitudes allow the force-distance measurements which reveal very short range force interactions.

AB - A highly sensitive noncontact atomic force microscope/scanning tunneling microscope (STM) operating in ultrahigh vacuum (UHV) with subangstrom oscillation amplitudes for atomic resolution imaging and force-distance spectroscopy was described. A novel fiber interferometer with very low noise levels was employed to detect cantilever displacements. The subangstrom oscillation amplitudes allow the force-distance measurements which reveal very short range force interactions.

UR - http://www.scopus.com/inward/record.url?scp=0042377551&partnerID=8YFLogxK

U2 - 10.1063/1.1593786

DO - 10.1063/1.1593786

M3 - Article

AN - SCOPUS:0042377551

SN - 0034-6748

VL - 74

SP - 3656

EP - 3663

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 8

ER -

High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (ne AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy

Özet

Belgeye Erişim

Diğer Dosyalar ve Linkler

Parmak izi

Alıntı Yap