Özet
We have used scanning tunneling microscopy to study the faceting of ⟨010⟩ oriented steps on Si(001) and Ge(001) surfaces. The ⟨010⟩ oriented steps on Si(001) tend to facet into local SA and SB step segments, whereas ⟨010⟩ oriented steps on Ge(001) meander along the mean ⟨010⟩ direction. We show that the step faceting behavior of the Si and Ge(001) surfaces is fully governed by the next-nearest-neighbor (NNN) interaction between the substrate dimers. Only in the case of a repulsive NNN interaction, as for Si(001), faceting occurs.
Orijinal dil | İngilizce |
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Dergi | Physical Review B - Condensed Matter and Materials Physics |
Hacim | 69 |
Basın numarası | 12 |
DOI'lar | |
Yayın durumu | Yayınlandı - 12 Mar 2004 |
Harici olarak yayınlandı | Evet |