Exposure Correction Model to Enhance Image Quality

F. Irem Eyiokur, Dogucan Yaman, Hazim Kemal Ekenel, Alexander Waibel

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5 Atıf (Scopus)

Özet

Exposure errors in an image cause a degradation in the contrast and low visibility in the content. In this paper, we address this problem and propose an end-to-end expo-sure correction model in order to handle both under- and overexposure errors with a single model. Our model contains an image encoder, consecutive residual blocks, and image decoder to synthesize the corrected image. We utilize perceptual loss, feature matching loss, and multi-scale discriminator to increase the quality of the generated image as well as to make the training more stable. The experimental results indicate the effectiveness of proposed model. We achieve the state-of-the-art result on a large-scale exposure dataset. Besides, we investigate the effect of exposure set-ting of the image on the portrait matting task. We find that under- and overexposed images cause severe degradation in the performance of the portrait matting models. We show that after applying exposure correction with the proposed model, the portrait matting quality increases significantly. https://github.com/yamand16/ExposureCorrection.

Orijinal dilİngilizce
Ana bilgisayar yayını başlığıProceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022
YayınlayanIEEE Computer Society
Sayfalar675-685
Sayfa sayısı11
ISBN (Elektronik)9781665487399
DOI'lar
Yayın durumuYayınlandı - 2022
Etkinlik2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022 - New Orleans, United States
Süre: 19 Haz 202220 Haz 2022

Yayın serisi

AdıIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Hacim2022-June
ISSN (Basılı)2160-7508
ISSN (Elektronik)2160-7516

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???event.eventtypes.event.conference???2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022
Ülke/BölgeUnited States
ŞehirNew Orleans
Periyot19/06/2220/06/22

Bibliyografik not

Publisher Copyright:
© 2022 IEEE.

Finansman

Acknowledgement. The project on which this report is based was funded by the Federal Ministry of Education and Research (BMBF) of Germany under the number 01IS18040A.

FinansörlerFinansör numarası
Bundesministerium für Bildung und Forschung01IS18040A

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