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Exploring Fault-Tolerance in RISC-V Architectures

  • Mustafa Ensar Iskin*
  • , Berna Ors Yalcin
  • , Ayse Yilmazer
  • *Bu çalışma için yazışmadan sorumlu yazar

Araştırma sonucu: Kitap/Rapor/Konferans Bildirisinde BölümKonferans katkısıbilirkişi

Özet

Fault tolerance is a critical aspect of modern electronic systems, particularly in environments like space, aviation, and automotive, where reliability is paramount. This paper examines the fault tolerance approaches in RISC-V architectures. Techniques such as spatial, temporal, and information redundancy are reviewed, with a focus on their integration into RISC-V-based systems. Comparative analysis of single-core and multi-core redundancy, including modular and heterogeneous approaches, demonstrates their impact on performance, energy efficiency, and cost. Testing methods ranging from simulation to real-world radiation exposure are evaluated. Finally, insights into future research opportunities are presented to guide the development of more robust and efficient fault-tolerant systems.

Orijinal dilİngilizce
Ana bilgisayar yayını başlığı2025 12th International Conference on Electrical and Electronics Engineering, ICEEE 2025
YayınlayanInstitute of Electrical and Electronics Engineers Inc.
Sayfalar19-23
Sayfa sayısı5
ISBN (Elektronik)9798331598440
DOI'lar
Yayın durumuYayınlandı - 2025
Etkinlik12th International Conference on Electrical and Electronics Engineering, ICEEE 2025 - Istanbul, Turkey
Süre: 24 Eyl 202526 Eyl 2025

Yayın serisi

Adı2025 12th International Conference on Electrical and Electronics Engineering, ICEEE 2025

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???event.eventtypes.event.conference???12th International Conference on Electrical and Electronics Engineering, ICEEE 2025
Ülke/BölgeTurkey
ŞehirIstanbul
Periyot24/09/2526/09/25

Bibliyografik not

Publisher Copyright:
© 2025 IEEE.

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