Erratum: Augmented Markov model for enhancing hazard rate result of safety critical systems possessing diverse redundant architecture (IEEE Trans. Veh. Technol. (2021) 70:9 (8606-8616) DOI: 10.1109/TVT.2021.3100534)

Ersin H. Dogruguven, Ilker Üstoglu

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Özet

In the above paper [1] there are errors introduced during typesetting which we correct here. 1) The last paragraph of Section VI-C, p. 8613, has capitalization errors. The correctly formatted text is as follows: Table IX shows transition rates to switch between the states shown in Fig. 9. Note that a special transition rate naming is used between states, which is called "Dogruguven Transition Rate notation," or short "DTN." Like Hungarian notation for clarifying the variable notation, this naming is very helpful to understand and implement any state machine approach such as Petri Nets or the Markovian model. The naming starts with a lower case "t," then the number showing the root state comes, hereafter and underscore "_" and finally the final state number. The implementation of the model is structured in this way, and then the transition rates are assigned to specific values such as "t0_21 = λ1SU + λ2SU - λCSU". This way of notation helps to avoid any systematic programming failures. 2) The line after equation (17), p. 8614, should be capitalized as follows: Table XI summarizes the results in detail where "Chl" stands for channel. 3) The first paragraph of Section VII-C, p. 8615, should be capitalized as follows: Table XII illustrates the values calculated regarding the standard IEC 62380 and safety characteristics like CCF. Data regarding other reliability standardsMIL-HDBK-217FN2 and 217Plus are not given separately for each parameter, however results are summarized.Matlab is used for safety calculations. 4) Tables XI, XII, and XIII are corrected as follows.

Orijinal dilİngilizce
Sayfa (başlangıç-bitiş)12287
Sayfa sayısı1
DergiIEEE Transactions on Vehicular Technology
Hacim70
Basın numarası11
DOI'lar
Yayın durumuYayınlandı - 1 Kas 2021

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© 2021 Institute of Electrical and Electronics Engineers Inc.. All rights reserved.

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