Electromagnetic Imaging of Rough Dielectric Surface Profiles using a Single-Frequency Reverse Time Migration Method

Ahmet Sefer, Ali Yapar, Hakan Bagci

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1 Atıf (Scopus)

Özet

An electromagnetic imaging scheme, which makes use of a single-frequency reverse time migration (RTM) technique to reconstruct two-dimensional (2D) rough surface profiles from the scattered field data, is formulated and implemented. The unknown surface profile, which is expressed as a one-dimensional height function, is the interface between two dielectric media. It is assumed that the profile is illuminated from one side and the scattered fields are 'measured' along a line on this same side. RTM is used to construct a cross-correlation imaging functional that is numerically evaluated to yield an image of the investigation domain. The maxima of this functional yields an accurate reconstruction of the rough dielectric surface profile.

Orijinal dilİngilizce
Ana bilgisayar yayını başlığı2023 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, AP-S/URSI 2023 - Proceedings
YayınlayanInstitute of Electrical and Electronics Engineers Inc.
Sayfalar467-468
Sayfa sayısı2
ISBN (Elektronik)9781665442282
DOI'lar
Yayın durumuYayınlandı - 2023
Etkinlik2023 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, AP-S/URSI 2023 - Portland, United States
Süre: 23 Tem 202328 Tem 2023

Yayın serisi

AdıIEEE Antennas and Propagation Society, AP-S International Symposium (Digest)
Hacim2023-July
ISSN (Basılı)1522-3965

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???event.eventtypes.event.conference???2023 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, AP-S/URSI 2023
Ülke/BölgeUnited States
ŞehirPortland
Periyot23/07/2328/07/23

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Publisher Copyright:
© 2023 IEEE.

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