Effect of temperature and film thickness on residual stress and texture of Rr2O3 buffer layers for YBCO coated conductor

Lutfi Arda; S. Ataoglu; O. Bulut

doi:10.1109/TASC.2009.2017882

Effect of temperature and film thickness on residual stress and texture of Rr₂O₃ buffer layers for YBCO coated conductor

Lutfi Arda^*, S. Ataoglu, O. Bulut

^*Bu çalışma için yazışmadan sorumlu yazar

İnşaat Mühendisliği Bölümü

University Besiktas

Araştırma sonucu: Dergiye katkı › Makale › bilirkişi

3 Atıf (Scopus)

Özet

Re₂O₃ (Re = Er, Gd, Ho, Y and Yb) was prepared by sol-gel synthesis using metal-organic precursors. Residual stress and microstructure in the Re₂O₃ buffer layers were investigated as a function of temperature and film thickness. Textured Re ₂O₃ buffer layers were grown on biaxially textured-Ni (100) substrates using chemical solution deposition. Films were annealed at 1150°C under a flowing 4 % H₂ - Ar gas. X-ray diffraction of the buffers showed strong out-of-plane orientation on Ni tape. Residual stress in various thicknesses of buffer layers was calculated. The surface morphologies and microstructure of all samples were characterized using SEM and AFM. &copy: 2009 IEEE.

Orijinal dil	İngilizce
Makale numarası	5153144
Sayfa (başlangıç-bitiş)	3291-3294
Sayfa sayısı	4
Dergi	IEEE Transactions on Applied Superconductivity
Hacim	19
Basın numarası	3
DOI'lar	https://doi.org/10.1109/TASC.2009.2017882
Yayın durumu	Yayınlandı - Haz 2009

Finansman

Manuscript received August 24, 2008. First published June 30, 2009; current version published July 15, 2009. The present work was supported by the Research Fund of Bahcesehir University. L. Arda is with the Bahcesehir University, Arts and Sciences Faculty, Be-siktas, 34349 Istanbul, Turkey (e-mail: [email protected]). S. Ataoglu and O. Bulut are with the Istanbul Technical University, Faculty of Civil Engineering, 34469 Istanbul, Turkey (e-mail: [email protected]; [email protected]). Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org Digital Object Identifier 10.1109/TASC.2009.2017882

Finansörler	Finansör numarası
Bahcesehir University

Belgeye Erişim

10.1109/TASC.2009.2017882

Diğer Dosyalar ve Linkler

Link to publication in Scopus

Alıntı Yap

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abstract = "Re2O3 (Re = Er, Gd, Ho, Y and Yb) was prepared by sol-gel synthesis using metal-organic precursors. Residual stress and microstructure in the Re2O3 buffer layers were investigated as a function of temperature and film thickness. Textured Re 2O3 buffer layers were grown on biaxially textured-Ni (100) substrates using chemical solution deposition. Films were annealed at 1150°C under a flowing 4 % H2 - Ar gas. X-ray diffraction of the buffers showed strong out-of-plane orientation on Ni tape. Residual stress in various thicknesses of buffer layers was calculated. The surface morphologies and microstructure of all samples were characterized using SEM and AFM. &copy: 2009 IEEE.",

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