Dynamical diffraction peak splitting in time-of-flight neutron diffraction

E. Üstündag; R. A. Karnesky; M. R. Daymond; I. C. Noyan

doi:10.1063/1.2402220

Dynamical diffraction peak splitting in time-of-flight neutron diffraction

E. Üstündag^*
, R. A. Karnesky
, M. R. Daymond
, I. C. Noyan

^*Bu çalışma için yazışmadan sorumlu yazar

Iowa State University
Northwestern University
Queen's University Kingston
Columbia University

Araştırma sonucu: Dergiye katkı › Makale › bilirkişi

Özet

Time-of-flight neutron diffraction data from 20 and 0.7 mm thick perfect Si single crystal samples, which exhibit dynamical diffraction effects associated with finite crystal size, are presented. This effect is caused by constructive interference occurring solely from thin layers bounded by the front (entry) and back (exit) surfaces of the sample with no scattering originating from the layers in between, resulting in two distinct peaks observed for each reflection. If the sample is thin and/or the instrument resolution is insufficient, these two peaks can convolve and cause peak shape aberrations which can lead to significant errors in the strain and peak-broadening parameters obtained from a kinematical diffraction analysis.

Orijinal dil	İngilizce
Makale numarası	233515
Dergi	Applied Physics Letters
Hacim	89
Basın numarası	23
DOI'lar	https://doi.org/10.1063/1.2402220
Yayın durumu	Yayınlandı - 2006
Harici olarak yayınlandı	Evet

Finansman

Funding was provided by the National Science Foundation (NSF) grants DMR-9985264 and IMR-MIP DMR-0412074. The authors acknowledge help from Dr. B. Clausen at the Los Alamos Neutron Science Center which is supported by the U.S. Department of Energy under Contract No. W-7405-ENG-36. The ENGIN-X diffractometer is located on the ISIS Pulsed Neutron Facility, Rutherford Appleton Laboratory, UK, where author M.R.D. was a staff member during the experiments.

Finansörler	Finansör numarası
National Science Foundation	DMR-9985264, IMR-MIP DMR-0412074
U.S. Department of Energy

Belgeye Erişim

10.1063/1.2402220

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Link to publication in Scopus

Alıntı Yap

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title = "Dynamical diffraction peak splitting in time-of-flight neutron diffraction",

abstract = "Time-of-flight neutron diffraction data from 20 and 0.7 mm thick perfect Si single crystal samples, which exhibit dynamical diffraction effects associated with finite crystal size, are presented. This effect is caused by constructive interference occurring solely from thin layers bounded by the front (entry) and back (exit) surfaces of the sample with no scattering originating from the layers in between, resulting in two distinct peaks observed for each reflection. If the sample is thin and/or the instrument resolution is insufficient, these two peaks can convolve and cause peak shape aberrations which can lead to significant errors in the strain and peak-broadening parameters obtained from a kinematical diffraction analysis.",

author = "E. {\"U}st{\"u}ndag and Karnesky, \{R. A.\} and Daymond, \{M. R.\} and Noyan, \{I. C.\}",

year = "2006",

doi = "10.1063/1.2402220",

language = "English",

volume = "89",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "23",

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TY - JOUR

T1 - Dynamical diffraction peak splitting in time-of-flight neutron diffraction

AU - Üstündag, E.

AU - Karnesky, R. A.

AU - Daymond, M. R.

AU - Noyan, I. C.

PY - 2006

Y1 - 2006

N2 - Time-of-flight neutron diffraction data from 20 and 0.7 mm thick perfect Si single crystal samples, which exhibit dynamical diffraction effects associated with finite crystal size, are presented. This effect is caused by constructive interference occurring solely from thin layers bounded by the front (entry) and back (exit) surfaces of the sample with no scattering originating from the layers in between, resulting in two distinct peaks observed for each reflection. If the sample is thin and/or the instrument resolution is insufficient, these two peaks can convolve and cause peak shape aberrations which can lead to significant errors in the strain and peak-broadening parameters obtained from a kinematical diffraction analysis.

AB - Time-of-flight neutron diffraction data from 20 and 0.7 mm thick perfect Si single crystal samples, which exhibit dynamical diffraction effects associated with finite crystal size, are presented. This effect is caused by constructive interference occurring solely from thin layers bounded by the front (entry) and back (exit) surfaces of the sample with no scattering originating from the layers in between, resulting in two distinct peaks observed for each reflection. If the sample is thin and/or the instrument resolution is insufficient, these two peaks can convolve and cause peak shape aberrations which can lead to significant errors in the strain and peak-broadening parameters obtained from a kinematical diffraction analysis.

UR - https://www.scopus.com/pages/publications/33845451282

U2 - 10.1063/1.2402220

DO - 10.1063/1.2402220

M3 - Article

AN - SCOPUS:33845451282

SN - 0003-6951

VL - 89

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 23

M1 - 233515

ER -

Dynamical diffraction peak splitting in time-of-flight neutron diffraction

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