Distribution of shallow NV centers in diamond revealed by photoluminescence spectroscopy and nanomachining

Majid Fazeli Jadidi, H. Özgür Özer, Saurav Goel, Jason I. Kilpatrick, Niall McEvoy, David McCloskey, John F. Donegan, Graham L.W. Cross*

*Bu çalışma için yazışmadan sorumlu yazar

Araştırma sonucu: ???type-name???Makalebilirkişi

8 Atıf (Scopus)

Özet

We performed nanomachining combined with photoluminescence spectroscopy to understand the depth distribution of nitrogen-vacancy (NV) centers formed by low energy nitrogen ion irradiation of the diamond surface. NV and NV0 fluorescence signals collected from the surface progressively machined by a diamond tip in an atomic force microscope (AFM) initially rise to a maximum at 5 nm depth before returning to background levels at 10 nm. This maximum corresponds to the defect depth distribution predicted by a SRIM simulation using a 2.5 keV implantation energy per nitrogen atom. Full extinguishing of implantation produced NV and NV0 zero phonon line peaks occurred beyond 10 nm machining depth, coinciding with the end of easy surface material removal and onset of significant tip wear. The wear ratio of for NV active, ion irradiated diamond compared to the single-crystal diamond tip was surprisingly found to be 22:1. The reported results constitute the first integrated study of in-situ machining and wear characterization via optical properties of the diamond surface containing shallow formed NV centers. We discuss possible metrology applications for diamond tools used in precision manufacturing.

Orijinal dilİngilizce
Sayfa (başlangıç-bitiş)114-121
Sayfa sayısı8
DergiCarbon
Hacim167
DOI'lar
Yayın durumuYayınlandı - 15 Eki 2020

Bibliyografik not

Publisher Copyright:
© 2020 Elsevier Ltd

Finansman

HOO acknowledges support of TÜBITAK ( 2219/1059B191600977 ) and Istanbul Technical Univesity ( BAP 39973 ). SG acknowledges support from the UKRI (Grants No.: EP/K503241/1 , EP/L016567/1 , EP/S013652/1 , EP/T001100/1 , EP/S036180/1 and EP/T024607/1 ), H2020 (Cost Actions ( CA18125 , CA18224 and CA16235 ) and EURAMET EMPIR A185 (2018)), Royal Academy of Engineering Grant No. IAPP18-19∖295 (Indo- UK partnership) and Grant No. TSP1332 (South Africa- UKpartnership), and Newton Fellowship award from the Royal Society ( NIF∖R1∖191571 ). HOO acknowledges support of T?BITAK (2219/1059B191600977) and Istanbul Technical Univesity (BAP 39973). SG acknowledges support from the UKRI (Grants No.: EP/K503241/1, EP/L016567/1, EP/S013652/1, EP/T001100/1, EP/S036180/1 and EP/T024607/1), H2020 (Cost Actions (CA18125, CA18224 and CA16235) and EURAMET EMPIR A185 (2018)), Royal Academy of Engineering Grant No. IAPP18-19?295 (Indo- UK partnership) and Grant No. TSP1332 (South Africa- UKpartnership), and Newton Fellowship award from the Royal Society (NIF?R1?191571).

FinansörlerFinansör numarası
Cost ActionsCA18125, CA18224, CA16235
T?BITAK
North American Interfraternal Foundation∖R1∖191571
Horizon 2020 Framework Programme
European Association of National Metrology InstitutesEMPIR A185
UK Research and InnovationEP/T001100/1, EP/L016567/1, EP/S013652/1, EP/T024607/1, EP/S036180/1, EP/K503241/1
Royal Academy of EngineeringIAPP18-19∖295, TSP1332
Royal Society191571
Türkiye Bilimsel ve Teknolojik Araştirma Kurumu2219/1059B191600977
Istanbul Teknik ÜniversitesiBAP 39973

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