Dione: An integrated measurement and defect prediction solution

Bora Caglayan*, Ayse Tosun Misirli, Gul Calikli, Ayse Bener, Turgay Aytac, Burak Turhan

*Bu çalışma için yazışmadan sorumlu yazar

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9 Atıf (Scopus)

Özet

We present an integrated measurement and defect prediction tool: Dione. Our tool enables organizations to measure, monitor, and control product quality through learning based defect prediction. Similar existing tools either provide data collection and analytics, or work just as a prediction engine. Therefore, companies need to deal with multiple tools with incompatible interfaces in order to deploy a complete measurement and prediction solution. Dione provides a fully integrated solution where data extraction, defect prediction and reporting steps fit seamlessly. In this paper, we present the major functionality and architectural elements of Dione followed by an overview of our demonstration.

Orijinal dilİngilizce
Ana bilgisayar yayını başlığıProceedings of the ACM SIGSOFT 20th International Symposium on the Foundations of Software Engineering, FSE 2012
DOI'lar
Yayın durumuYayınlandı - 2012
Harici olarak yayınlandıEvet
Etkinlik20th ACM SIGSOFT International Symposium on the Foundations of Software Engineering, FSE 2012 - Cary, NC, United States
Süre: 11 Kas 201216 Kas 2012

Yayın serisi

AdıProceedings of the ACM SIGSOFT 20th International Symposium on the Foundations of Software Engineering, FSE 2012

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???event.eventtypes.event.conference???20th ACM SIGSOFT International Symposium on the Foundations of Software Engineering, FSE 2012
Ülke/BölgeUnited States
ŞehirCary, NC
Periyot11/11/1216/11/12

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