Özet
The results of investigations low frequency dielectric relaxation in layered ferroelectric TlInS2 crystals are presented. The measurements were performed in the temperature range of 180-230 K and in the frequency range of 5 kHz-1 MHz. Two different relaxation processes were observed in mentioned temperature interval. The crystal has "slow" and "fast" relaxation mechanisms in low and high frequency region, respectively. The presence of two different relaxation mechanisms in TlInS2 is discussed.
| Orijinal dil | İngilizce |
|---|---|
| Sayfa (başlangıç-bitiş) | 626-630 |
| Sayfa sayısı | 5 |
| Dergi | Crystal Research and Technology |
| Hacim | 42 |
| Basın numarası | 6 |
| DOI'lar | |
| Yayın durumu | Yayınlandı - Haz 2007 |
Parmak izi
Dielectric relaxation in ferroelectric TlInS2 layered crystals within metastable chaotic state' araştırma başlıklarına git. Birlikte benzersiz bir parmak izi oluştururlar.Alıntı Yap
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