Detecting and locating dielectric objects buried under a rough interface

Yasemin Altuncu; Ibrahim Akduman; Ali Yapar

doi:10.1109/LGRS.2007.890550

Detecting and locating dielectric objects buried under a rough interface

Yasemin Altuncu^*
, Ibrahim Akduman
, Ali Yapar

^*Bu çalışma için yazışmadan sorumlu yazar

Elektronik ve Hab.Müh.Bölümü

Istanbul Technical University
IEEE

Araştırma çıktısı: Dergi yayını › Makale › Hakem

29 Atıf (Scopus)

Özet

We present a method to detect and locate dielectric objects buried under a rough surface. The method is based on the determination of appearing surface impedance of the half-space, where the dielectric objects are located. The equivalent surface impedance is obtained directly from the impedance boundary condition, which requires the knowledge of the electric field and its normal derivative on the surface. These field values are obtained by measuring the far-field data and using single-layer-potential representation of the scattered field. Using the equivalent surface impedance, one can detect and locate the buried objects. The efficiency and efficacy of the method are tested via numerical simulations.

Orijinal dil	İngilizce
Sayfa (başlangıç-bitiş)	251-255
Sayfa sayısı	5
Dergi	IEEE Geoscience and Remote Sensing Letters
Hacim	4
Basın numarası	2
DOI'lar	https://doi.org/10.1109/LGRS.2007.890550
Yayın durumu	Yayınlandı - Nis 2007

Finansman

Manuscript received August 23, 2006; revised October 30, 2006. This work was supported by the Turkish Scientific and Technological Research Council under Grant 105E029. The authors are with the Istanbul Technical University, Electrical and Electronics Engineering Faculty, 34469 Maslak, Istanbul, Turkey. Digital Object Identifier 10.1109/LGRS.2007.890550

Finansörler	Finansör numarası
Consejo Nacional para Investigaciones Científicas y Tecnológicas	105E029

Belgeye Erişim

10.1109/LGRS.2007.890550

Diğer Dosyalar ve Linkler

Link to publication in Scopus

Alıntı Yap

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abstract = "We present a method to detect and locate dielectric objects buried under a rough surface. The method is based on the determination of appearing surface impedance of the half-space, where the dielectric objects are located. The equivalent surface impedance is obtained directly from the impedance boundary condition, which requires the knowledge of the electric field and its normal derivative on the surface. These field values are obtained by measuring the far-field data and using single-layer-potential representation of the scattered field. Using the equivalent surface impedance, one can detect and locate the buried objects. The efficiency and efficacy of the method are tested via numerical simulations.",

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AU - Yapar, Ali

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N2 - We present a method to detect and locate dielectric objects buried under a rough surface. The method is based on the determination of appearing surface impedance of the half-space, where the dielectric objects are located. The equivalent surface impedance is obtained directly from the impedance boundary condition, which requires the knowledge of the electric field and its normal derivative on the surface. These field values are obtained by measuring the far-field data and using single-layer-potential representation of the scattered field. Using the equivalent surface impedance, one can detect and locate the buried objects. The efficiency and efficacy of the method are tested via numerical simulations.

AB - We present a method to detect and locate dielectric objects buried under a rough surface. The method is based on the determination of appearing surface impedance of the half-space, where the dielectric objects are located. The equivalent surface impedance is obtained directly from the impedance boundary condition, which requires the knowledge of the electric field and its normal derivative on the surface. These field values are obtained by measuring the far-field data and using single-layer-potential representation of the scattered field. Using the equivalent surface impedance, one can detect and locate the buried objects. The efficiency and efficacy of the method are tested via numerical simulations.

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KW - Single-layer potential

KW - Surface impedance

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JO - IEEE Geoscience and Remote Sensing Letters

JF - IEEE Geoscience and Remote Sensing Letters

IS - 2

ER -

Detecting and locating dielectric objects buried under a rough interface

Özet

Finansman

Belgeye Erişim

Diğer Dosyalar ve Linkler

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