Comparative Evaluation of Multiline TRL and 2X-Thru De-Embedding Implementation Methods on Printed Circuit Board Measurements

Tugce Ayrac, Anil Ozdemirli, Emre Apaydin, Kemal Ozanoglu, Metin Yazgi

Araştırma sonucu: ???type-name???Konferans katkısıbilirkişi

1 Atıf (Scopus)

Özet

This work presents a comprehensive study of two different de-embedding techniques: the Multiline method and the 2X-Thru fixture removal. The methods are compared in terms of calibration standard requirements, de-embedding methodology, fixture removing accuracy, and de-embedding results. The comparison reveals that the accuracy of the Multiline method strictly depends on the impedance variation between calibration standards. The 2X-Thru with impedance correction, on the other hand, is more prone to impedance variation since it relies on a single calibration standard, which also eases the measurement routine and reduces the complexity. One important aim of this study is to contribute to the development of open-source de-embedding tools since the validity and accuracy of commercial tools cannot be evaluated for academic purposes.

Orijinal dilİngilizce
Ana bilgisayar yayını başlığıProceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023
YayınlayanInstitute of Electrical and Electronics Engineers Inc.
ISBN (Elektronik)9798350332650
DOI'lar
Yayın durumuYayınlandı - 2023
Harici olarak yayınlandıEvet
Etkinlik19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023 - Funchal, Portugal
Süre: 3 Tem 20235 Tem 2023

Yayın serisi

AdıProceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023

???event.eventtypes.event.conference???

???event.eventtypes.event.conference???19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023
Ülke/BölgePortugal
ŞehirFunchal
Periyot3/07/235/07/23

Bibliyografik not

Publisher Copyright:
© 2023 IEEE.

Parmak izi

Comparative Evaluation of Multiline TRL and 2X-Thru De-Embedding Implementation Methods on Printed Circuit Board Measurements' araştırma başlıklarına git. Birlikte benzersiz bir parmak izi oluştururlar.

Alıntı Yap