Combining view-based pose normalization and feature transform for cross-pose face recognition

Hua Gao, Hazim Kemal Ekenel, Rainer Stiefelhagen

Araştırma sonucu: ???type-name???Konferans katkısıbilirkişi

6 Atıf (Scopus)

Özet

Automatic face recognition across large pose changes is still a challenging problem. Previous solutions apply a transform in image space or feature space for normalizing the pose mismatch. For feature transform, the feature vector extracted on a probe facial image is transferred to match the gallery condition with regression models. Usually, the regression models are learned from paired gallery-probe conditions, in which pose angles are known or accurately estimated. The solution based on image transform is able to handle continuous pose changes, yet the approach suffers from warping artifacts due to misalignment and self-occlusion. In this work, we propose a novel approach, which combines the advantage of both methods. The algorithm is able to handle continuous pose mismatch in gallery and probe set, mitigating the impact of inaccurate pose estimation in feature-transform-based method. We evaluate the proposed algorithm on the FERET face database, where the pose angles are roughly annotated. Experimental results show that our proposed method is superior to solely image/feature transform methods, especially when the pose angle difference is large.

Orijinal dilİngilizce
Ana bilgisayar yayını başlığıProceedings of 2015 International Conference on Biometrics, ICB 2015
YayınlayanInstitute of Electrical and Electronics Engineers Inc.
Sayfalar487-492
Sayfa sayısı6
ISBN (Elektronik)9781479978243
DOI'lar
Yayın durumuYayınlandı - 29 Haz 2015
Etkinlik8th IAPR International Conference on Biometrics, ICB 2015 - Phuket, Thailand
Süre: 19 May 201522 May 2015

Yayın serisi

AdıProceedings of 2015 International Conference on Biometrics, ICB 2015

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???event.eventtypes.event.conference???8th IAPR International Conference on Biometrics, ICB 2015
Ülke/BölgeThailand
ŞehirPhuket
Periyot19/05/1522/05/15

Bibliyografik not

Publisher Copyright:
© 2015 IEEE.

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