Characterization of fiber/matrix interfaces using X-ray microtopography

Jay C. Hanan, C. Can Aydiner, Ersan Üstündag*, Geoffrey A. Swift, Steffen K. Kaldor, I. Cevdet Noyan

*Bu çalışma için yazışmadan sorumlu yazar

Araştırma sonucu: Dergiye katkıKonferans makalesibilirkişi

1 Atıf (Scopus)

Özet

The structure and strength of fiber/matrix interfaces in fiber-reinforced composites are crucial in determining the overall mechanical behavior of these materials. To investigate the integrity and structure of such an interface on the microstructure scale, a model composite consisting of a single crystal Al2O3 fiber in an Al matrix was investigated with X-ray microdiffraction. The intensity of the (30.0) and (22.0) reflections of Al2O3 was monitored in topography mode using an X-ray beam focused by a tapered capillary to spot sizes ranging from 5 to 25 μm. Significant changes in this intensity revealed buried voids along a nominally intact interface. These changes also provided information about the distribution of residual stresses along the interface. The discussion includes advantages and some complications with this technique for measuring residual stresses in composites.

Orijinal dilİngilizce
Sayfa (başlangıç-bitiş)919-924
Sayfa sayısı6
DergiMaterials Science Forum
Hacim404-407
DOI'lar
Yayın durumuYayınlandı - 2002
Harici olarak yayınlandıEvet
EtkinlikProceedings of the 6th European Conference on Residual Stresses - Coimbra, Portugal
Süre: 10 Tem 200212 Tem 2002

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