Attribute Profiles in Earthquake Damage Identification from Very High Resolution Post Event Image

Enes Oguzhan Alatas, Gilsen Taskin

Araştırma sonucu: Kitap/Rapor/Konferans Bildirisinde BölümKonferans katkısıbilirkişi

4 Atıf (Scopus)

Özet

For an accurate earthquake damage assessment from very high resolution (VHR) images, contextual relations between pixels need to be included in conjunction with spectral information during the classification. To utilize the spatial information in an efficient way, specific patterns representing the earthquake-induced damage should properly be modelled. Attribute Profiles (APs) and Multi Attribute Profiles (MAPs) provide a multi-dimensional representation of an image with a successive implementation of different attribute filters, and they are able to generate the complicated features for a specific pattern. In this study, the APs and the MAPs were used for the first time to extract the additional contextual features from very high resolution satellite image of City of Bam (Iran) acquired eight days after the earthquake. The performance of the morphological attribute features was compared to the those of Haralick's features (HFs) using the k-nn classifier, and the preliminary results showed that the APs and MAPs detect the earthquake damage more accurate than the HFs.

Orijinal dilİngilizce
Ana bilgisayar yayını başlığı2019 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Proceedings
YayınlayanInstitute of Electrical and Electronics Engineers Inc.
Sayfalar9299-9302
Sayfa sayısı4
ISBN (Elektronik)9781538691540
DOI'lar
Yayın durumuYayınlandı - Tem 2019
Etkinlik39th IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Yokohama, Japan
Süre: 28 Tem 20192 Ağu 2019

Yayın serisi

AdıInternational Geoscience and Remote Sensing Symposium (IGARSS)

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???event.eventtypes.event.conference???39th IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019
Ülke/BölgeJapan
ŞehirYokohama
Periyot28/07/192/08/19

Bibliyografik not

Publisher Copyright:
© 2019 IEEE.

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