Atomic resolution force imaging through the static deflection of the cantilever in simultaneous Scanning Tunneling/Atomic Force Microscopy

Araştırma sonucu: ???type-name???Makalebilirkişi

5 Atıf (Scopus)

Özet

We report simultaneous Force -static deflection of the cantilever-, Force Gradient and Scanning Tunneling topography images of Si(111)(7 × 7) surface using an off-resonance small amplitude non-contact atomic force microscopy technique with improved force sensitivity. The signal-to-noise ratio of the fiber interferometer used to detect the deflections of the cantilever was improved by applying an RF-modulation into the diode laser, which suppresses the noise in the laser. The measured sensitivity of ∼20 fm/√Hz allows us to obtain atom resolved images of the surface in static deflection of the cantilever, simultaneously with the other imaging channels.

Orijinal dilİngilizce
Sayfa (başlangıç-bitiş)54-57
Sayfa sayısı4
DergiUltramicroscopy
Hacim196
DOI'lar
Yayın durumuYayınlandı - Oca 2019

Bibliyografik not

Publisher Copyright:
© 2018 Elsevier B.V.

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