Analysis of paper and board along the cross-section by Raman microscopy

E. Pigorsch; M. Finger; G. Gärtner; S. Thiele; E. Brunner

Analysis of paper and board along the cross-section by Raman microscopy

E. Pigorsch, M. Finger, G. Gärtner, S. Thiele, E. Brunner

Araştırma sonucu: Uzmanlık yayınına katkı › Makale

Özet

About ten years ago, improvements in the measuring technology of Raman spectroscopy led to its development from a purely scientific method into a routine laboratory procedure. Raman spectroscopy has significant advantages over other spectroscopic measurements and is particularly suitable for chemical analysis of paper which requires high local resolution and high chemical specificity. In combination with the already widely used scanning electron microscopy (SEM), Raman microscopy can provide new insights into the chemical structure of paper and board as it has not been possible by means of the analytical methods used so far.

Orijinal dil	İngilizce
Sayfalar	14-18
Sayfa sayısı	5
Hacim	69
Hayır	3
Uzman yayını	ATIP. Association Technique de L'Industrie Papetiere
Yayın durumu	Yayınlandı - 1 Eki 2015
Harici olarak yayınlandı	Evet

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Link to publication in Scopus

Alıntı Yap

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title = "Analysis of paper and board along the cross-section by Raman microscopy",

abstract = "About ten years ago, improvements in the measuring technology of Raman spectroscopy led to its development from a purely scientific method into a routine laboratory procedure. Raman spectroscopy has significant advantages over other spectroscopic measurements and is particularly suitable for chemical analysis of paper which requires high local resolution and high chemical specificity. In combination with the already widely used scanning electron microscopy (SEM), Raman microscopy can provide new insights into the chemical structure of paper and board as it has not been possible by means of the analytical methods used so far.",

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T1 - Analysis of paper and board along the cross-section by Raman microscopy

AU - Pigorsch, E.

AU - Finger, M.

AU - Gärtner, G.

AU - Thiele, S.

AU - Brunner, E.

PY - 2015/10/1

Y1 - 2015/10/1

N2 - About ten years ago, improvements in the measuring technology of Raman spectroscopy led to its development from a purely scientific method into a routine laboratory procedure. Raman spectroscopy has significant advantages over other spectroscopic measurements and is particularly suitable for chemical analysis of paper which requires high local resolution and high chemical specificity. In combination with the already widely used scanning electron microscopy (SEM), Raman microscopy can provide new insights into the chemical structure of paper and board as it has not been possible by means of the analytical methods used so far.

AB - About ten years ago, improvements in the measuring technology of Raman spectroscopy led to its development from a purely scientific method into a routine laboratory procedure. Raman spectroscopy has significant advantages over other spectroscopic measurements and is particularly suitable for chemical analysis of paper which requires high local resolution and high chemical specificity. In combination with the already widely used scanning electron microscopy (SEM), Raman microscopy can provide new insights into the chemical structure of paper and board as it has not been possible by means of the analytical methods used so far.

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M3 - Article

AN - SCOPUS:84951273442

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JO - ATIP. Association Technique de L'Industrie Papetiere

JF - ATIP. Association Technique de L'Industrie Papetiere

ER -

Analysis of paper and board along the cross-section by Raman microscopy

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