Analog negative-bias-temperature-instability monitoring circuit

Mustafa Berke Yelten; Paul D. Franzon; Michael B. Steer

doi:10.1109/TDMR.2011.2178096

Analog negative-bias-temperature-instability monitoring circuit

Mustafa Berke Yelten^*
, Paul D. Franzon
, Michael B. Steer

^*Bu çalışma için yazışmadan sorumlu yazar

Intel
North Carolina State University

Araştırma sonucu: Dergiye katkı › Makale › bilirkişi

9 Atıf (Scopus)

Özet

A negative-bias-temperature-instability (NBTI) monitor subcircuit is presented and implemented in 65-nm CMOS technology. The subcircuit can be incorporated in various analog circuit blocks subject to different variability, stress, and aging histories. For an amplifier block, the NBTI monitor is a linear sensor, and sensing is provided as variation of the amplifier gain in response to NBTI-induced bias variation. The monitor sensitivity in this configuration is 3.15 V ^-1 and is demonstrated through electrothermal stress on the amplifier circuit.

Orijinal dil	İngilizce
Makale numarası	6095343
Sayfa (başlangıç-bitiş)	177-179
Sayfa sayısı	3
Dergi	IEEE Transactions on Device and Materials Reliability
Hacim	12
Basın numarası	1
DOI'lar	https://doi.org/10.1109/TDMR.2011.2178096
Yayın durumu	Yayınlandı - Mar 2012
Harici olarak yayınlandı	Evet

Finansman

Manuscript received August 30, 2011; revised October 24, 2011; accepted November 21, 2011. Date of publication December 5, 2011; date of current version March 7, 2012. This work was supported in part by the Self-Healing Mixed-Signal Integrated Circuits program of the Defense Advanced Research Projects Agency and in part by the prime contractor Raytheon Company under Contract/Grant FA8650-09-C-7925.

Finansörler	Finansör numarası
Defense Advanced Research Projects Agency
Raytheon Company	FA8650-09-C-7925

Belgeye Erişim

10.1109/TDMR.2011.2178096

Diğer Dosyalar ve Linkler

Link to publication in Scopus

Alıntı Yap

@article{1709f8bbc18d4ddbba9a3609b657c2c4,

title = "Analog negative-bias-temperature-instability monitoring circuit",

abstract = "A negative-bias-temperature-instability (NBTI) monitor subcircuit is presented and implemented in 65-nm CMOS technology. The subcircuit can be incorporated in various analog circuit blocks subject to different variability, stress, and aging histories. For an amplifier block, the NBTI monitor is a linear sensor, and sensing is provided as variation of the amplifier gain in response to NBTI-induced bias variation. The monitor sensitivity in this configuration is 3.15 V -1 and is demonstrated through electrothermal stress on the amplifier circuit.",

keywords = "Amplifier, analog circuits, negative-bias temperature instability (NBTI), reliability, sensor",

author = "Yelten, \{Mustafa Berke\} and Franzon, \{Paul D.\} and Steer, \{Michael B.\}",

year = "2012",

month = mar,

doi = "10.1109/TDMR.2011.2178096",

language = "English",

volume = "12",

pages = "177--179",

journal = "IEEE Transactions on Device and Materials Reliability",

issn = "1530-4388",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "1",

}

TY - JOUR

T1 - Analog negative-bias-temperature-instability monitoring circuit

AU - Yelten, Mustafa Berke

AU - Franzon, Paul D.

AU - Steer, Michael B.

PY - 2012/3

Y1 - 2012/3

N2 - A negative-bias-temperature-instability (NBTI) monitor subcircuit is presented and implemented in 65-nm CMOS technology. The subcircuit can be incorporated in various analog circuit blocks subject to different variability, stress, and aging histories. For an amplifier block, the NBTI monitor is a linear sensor, and sensing is provided as variation of the amplifier gain in response to NBTI-induced bias variation. The monitor sensitivity in this configuration is 3.15 V -1 and is demonstrated through electrothermal stress on the amplifier circuit.

AB - A negative-bias-temperature-instability (NBTI) monitor subcircuit is presented and implemented in 65-nm CMOS technology. The subcircuit can be incorporated in various analog circuit blocks subject to different variability, stress, and aging histories. For an amplifier block, the NBTI monitor is a linear sensor, and sensing is provided as variation of the amplifier gain in response to NBTI-induced bias variation. The monitor sensitivity in this configuration is 3.15 V -1 and is demonstrated through electrothermal stress on the amplifier circuit.

KW - Amplifier

KW - analog circuits

KW - negative-bias temperature instability (NBTI)

KW - reliability

KW - sensor

UR - https://www.scopus.com/pages/publications/84858131218

U2 - 10.1109/TDMR.2011.2178096

DO - 10.1109/TDMR.2011.2178096

M3 - Article

AN - SCOPUS:84858131218

SN - 1530-4388

VL - 12

SP - 177

EP - 179

JO - IEEE Transactions on Device and Materials Reliability

JF - IEEE Transactions on Device and Materials Reliability

IS - 1

M1 - 6095343

ER -

Analog negative-bias-temperature-instability monitoring circuit

Özet

Finansman

Belgeye Erişim

Diğer Dosyalar ve Linkler

Parmak izi

Alıntı Yap