TY - JOUR
T1 - An integrated decision analytic framework of machine learning with multi-criteria decision making for multi-attribute inventory classification
AU - Kartal, Hasan
AU - Oztekin, Asil
AU - Gunasekaran, Angappa
AU - Cebi, Ferhan
N1 - Publisher Copyright:
© 2016 Elsevier Ltd
PY - 2016/11/1
Y1 - 2016/11/1
N2 - The purpose of this study is to develop a hybrid methodology that integrates machine learning algorithms with multi-criteria decision making (MCDM) techniques to effectively conduct multi-attribute inventory analysis. In the proposed methodology, first, ABC analyses using three different MCDM methods (i.e. simple-additive weighting, analytical hierarchy process, and VIKOR) are employed to determine the appropriate class for each of the inventory items. Following this, naïve Bayes, Bayesian network, artificial neural network (ANN), and support vector machine (SVM) algorithms are implemented to predict classes of initially determined stock items. Finally, the detailed prediction performance metrics of algorithms for each method are determined. The comprehensive case study executed at a large-scale automotive company revealed that the best classification accuracy is achieved by SVMs. The results also revealed that Bayesian networks, SVMs and ANNs are all capable of successfully dealing with the unbalanced data problems associated with Pareto distribution, and each of these algorithms performed well against all examined measures, thus validating the fact that machine learning algorithms are highly applicable to inventory classification problems. Therefore, this study presents uniqueness in that it is the first and foremost of its kind to effectively combine MCDM methods with machine learning algorithms in multi-attribute inventory classification and is practically applicable in various inventory settings. Furthermore, this study also provides a comprehensive chronological overview of the existing literature of machine learning methods within inventory classification problems.
AB - The purpose of this study is to develop a hybrid methodology that integrates machine learning algorithms with multi-criteria decision making (MCDM) techniques to effectively conduct multi-attribute inventory analysis. In the proposed methodology, first, ABC analyses using three different MCDM methods (i.e. simple-additive weighting, analytical hierarchy process, and VIKOR) are employed to determine the appropriate class for each of the inventory items. Following this, naïve Bayes, Bayesian network, artificial neural network (ANN), and support vector machine (SVM) algorithms are implemented to predict classes of initially determined stock items. Finally, the detailed prediction performance metrics of algorithms for each method are determined. The comprehensive case study executed at a large-scale automotive company revealed that the best classification accuracy is achieved by SVMs. The results also revealed that Bayesian networks, SVMs and ANNs are all capable of successfully dealing with the unbalanced data problems associated with Pareto distribution, and each of these algorithms performed well against all examined measures, thus validating the fact that machine learning algorithms are highly applicable to inventory classification problems. Therefore, this study presents uniqueness in that it is the first and foremost of its kind to effectively combine MCDM methods with machine learning algorithms in multi-attribute inventory classification and is practically applicable in various inventory settings. Furthermore, this study also provides a comprehensive chronological overview of the existing literature of machine learning methods within inventory classification problems.
KW - ABC analysis
KW - Business analytics
KW - Data mining
KW - Multi-attribute inventory classification
UR - http://www.scopus.com/inward/record.url?scp=84977512343&partnerID=8YFLogxK
U2 - 10.1016/j.cie.2016.06.004
DO - 10.1016/j.cie.2016.06.004
M3 - Article
AN - SCOPUS:84977512343
SN - 0360-8352
VL - 101
SP - 599
EP - 613
JO - Computers and Industrial Engineering
JF - Computers and Industrial Engineering
ER -