Özet
An approximation is derived for longitudinally inhomogeneous waveguides (LIW). Total reflections are adopted for a rough approximation through the tracking of the main reflected and transmitted fields in the multilayered dielectric structure. This approximation can be used to determine the thickness of layers of which the dielectric properties are known. Although the obtained thickness values are a rough approximation for the exact values, they provide a utility for iterative optimization algorithms for which the initial values are vital.
| Orijinal dil | İngilizce |
|---|---|
| Ana bilgisayar yayını başlığı | 2016 International Symposium on Fundamentals of Electrical Engineering, ISFEE 2016 |
| Yayınlayan | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Elektronik) | 9781467395755 |
| DOI'lar | |
| Yayın durumu | Yayınlandı - 30 Ara 2016 |
| Etkinlik | 2016 International Symposium on Fundamentals of Electrical Engineering, ISFEE 2016 - Bucharest, Romania Süre: 30 Haz 2016 → 2 Tem 2016 |
Yayın serisi
| Adı | 2016 International Symposium on Fundamentals of Electrical Engineering, ISFEE 2016 |
|---|
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| ???event.eventtypes.event.conference??? | 2016 International Symposium on Fundamentals of Electrical Engineering, ISFEE 2016 |
|---|---|
| Ülke/Bölge | Romania |
| Şehir | Bucharest |
| Periyot | 30/06/16 → 2/07/16 |
Bibliyografik not
Publisher Copyright:© 2016 IEEE.
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