Özet
Uncertainty Quantification (UQ) is crucial for deploying reliable Deep Learning (DL) models in high-stakes applications. Recently, General Type-2 Fuzzy Logic Systems (GT2FLSs) have proved to be effective for UQ, offering Prediction Intervals (PIs) to capture uncertainty. However, existing methods often struggle with computational efficiency and adaptability, as generating PIs for new coverage levels (φd) typically requires retraining the model. Moreover, methods that directly estimate the entire conditional distribution for UQ are computationally expensive, limiting their scalability in real-world scenarios. This study addresses these challenges by proposing a blueprint calibration strategy for GT2-FLSs, enabling efficient adaptation to any desired φd without retraining. By exploring the relationship between α-plane type reduced sets and uncertainty coverage, we develop two calibration methods: a lookup table-based approach and a derivative-free optimization algorithm. These methods allow GT2-FLSs to produce accurate and reliable PIs while significantly reducing computational overhead. Experimental results on high-dimensional datasets demonstrate that the calibrated GT2-FLS achieves superior performance in UQ, highlighting its potential for scalable and practical applications.
| Orijinal dil | İngilizce |
|---|---|
| Ana bilgisayar yayını başlığı | 2025 IEEE International Conference on Fuzzy Systems, FUZZ-IEEE 2025 - Proceedings |
| Yayınlayan | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Elektronik) | 9798331543198 |
| DOI'lar | |
| Yayın durumu | Yayınlandı - 2025 |
| Etkinlik | 2025 IEEE International Conference on Fuzzy Systems, FUZZ-IEEE 2025 - Reims, France Süre: 6 Tem 2025 → 9 Tem 2025 |
Yayın serisi
| Adı | IEEE International Conference on Fuzzy Systems |
|---|---|
| ISSN (Basılı) | 1098-7584 |
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| ???event.eventtypes.event.conference??? | 2025 IEEE International Conference on Fuzzy Systems, FUZZ-IEEE 2025 |
|---|---|
| Ülke/Bölge | France |
| Şehir | Reims |
| Periyot | 6/07/25 → 9/07/25 |
Bibliyografik not
Publisher Copyright:© 2025 IEEE.
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