Abstract
In this paper, it is analyzed how different loss functions affect the performance of domain adaptation in the field of semantic segmentation. Semantic segmentation is a pixel-wise classification problem of an image. Large amounts of annotated data are required to train successfully in multi-parameter deep learning architectures. In recent years, several works have demonstrated that synthetic datasets are a good alternative since they are automatically annotated in virtual environments. However, due to the different distribution of source and target datasets, there is a decrease in performance. Domain adaptation methods address this problem by decreasing gap between source and target data. In this study, it is investigated that the effect of Cross- Entropy, Lovasz-Softmax, Dice Coefficient, Tversky and mean Intersection-over-Union Loss functions on domain adaptation in semantic segmentation. For our study, KITTI and Virtual KITTI datasets are used for real and synthetic images respectively. By evaluating the quantitative results, it is observed that the Dice Coefficient is relatively more successful.
Translated title of the contribution | Effect of loss functions on domain adaptation in semantic segmentation |
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Original language | Turkish |
Title of host publication | SIU 2021 - 29th IEEE Conference on Signal Processing and Communications Applications, Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781665436496 |
DOIs | |
Publication status | Published - 9 Jun 2021 |
Externally published | Yes |
Event | 29th IEEE Conference on Signal Processing and Communications Applications, SIU 2021 - Virtual, Istanbul, Turkey Duration: 9 Jun 2021 → 11 Jun 2021 |
Publication series
Name | SIU 2021 - 29th IEEE Conference on Signal Processing and Communications Applications, Proceedings |
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Conference
Conference | 29th IEEE Conference on Signal Processing and Communications Applications, SIU 2021 |
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Country/Territory | Turkey |
City | Virtual, Istanbul |
Period | 9/06/21 → 11/06/21 |
Bibliographical note
Publisher Copyright:© 2021 IEEE.