Vacuum package design for a MEMS based IR detector array

J. Ollila*, M. F. Toy, O. Ferhanoglu, P. Karioja, H. Urey

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

A vacuum package was designed and manufactured for the testing of a MEMS-based thermal imaging detector array. Optimum operation of the pixel array requires low pressure and stabilized temperature. The pixel array devices are under development; therefore, the package needs to be reusable as a test fixture for chip revisions. Two optical windows are required: the top window to be transmissive at the long-wave infra-red (LWIR) wavelengths and the bottom window at visible (VIS) readout wavelengths. Thermal noise is a fundamental source deteriorating the performance of the pixel array; hence, a thermocoupler, thermo electric cooler (TEC) and heatsink were included in the package to allow thermal stabilization. To minimize the thermal noise, the TEC and heatsink were located between the VIS window and the pixel array. Such a configuration for thermal stabilization resulted in the use of special TEC and heatsink designs that include holes matched with the VIS window size. Simulations on pixel array performance indicate a 1 mTorr vacuum pressure to provide the optimum performance of the pixel array. In order to meet the vacuum requirement, a Kovar package with the minimum possible size, considering the size of elements assembled in the package, was chosen. The removable ZnSe IR window was hermetically sealed with an O-ring and vacuum grease. The VIS window was glass soldered to the bottom of the package. Active pressure control was obtained by a vacuum pump.

Original languageEnglish
Title of host publication16th European Microelectronics and Packaging Conference and Exhibition 2007, EMPC 2007
Pages289-292
Number of pages4
Publication statusPublished - 2007
Externally publishedYes
Event16th European Microelectronics and Packaging Conference and Exhibition 2007, EMPC 2007 - Oulu, Finland
Duration: 17 Jun 200720 Jun 2007

Publication series

Name16th European Microelectronics and Packaging Conference and Exhibition 2007, EMPC 2007

Conference

Conference16th European Microelectronics and Packaging Conference and Exhibition 2007, EMPC 2007
Country/TerritoryFinland
CityOulu
Period17/06/0720/06/07

Keywords

  • IR detector packaging
  • IR testing
  • MEMS
  • Thermal testing
  • Vacuum packaging

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