Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2 × 1)

H. Özgür Özer; Mehrdad Atabak; Ahmet Oral

doi:10.1016/S0038-1098(02)00547-1

Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2 × 1)

H. Özgür Özer, Mehrdad Atabak, Ahmet Oral^*

^*Corresponding author for this work

Bilkent University

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Si(100)(2 × 1) surface is imaged using a new nc-AFM (non-contact atomic force microscopy)/STM with sub-Ångstrom oscillation amplitudes using stiff hand-made tungsten levers. Simultaneous force gradient and scanning tunneling microscopy images of individual dimers and atomic scale defects are obtained. We measured force-distance and dissipation-distance curves with different tips. Some of the tips show long-range force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM. We also observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy-distance curve.

Original language	English
Pages (from-to)	469-472
Number of pages	4
Journal	Solid State Communications
Volume	124
Issue number	12
DOIs	https://doi.org/10.1016/S0038-1098(02)00547-1
Publication status	Published - Dec 2002
Externally published	Yes

Funding

We are grateful to Professor Salim Çıracı for his continuous support and guidance as a teacher, mentor and friend over the years. This project is partially supported by The British Council and The NanoMagnetics Instruments Ltd [16] .

Funders	Funder number
NanoMagnetics Instruments Ltd
British Council

Keywords

A. Si (100) surface
E. nc-AFM/STM studies

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10.1016/S0038-1098(02)00547-1

Cite this

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title = "Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2 × 1)",

abstract = "Si(100)(2 × 1) surface is imaged using a new nc-AFM (non-contact atomic force microscopy)/STM with sub-{\AA}ngstrom oscillation amplitudes using stiff hand-made tungsten levers. Simultaneous force gradient and scanning tunneling microscopy images of individual dimers and atomic scale defects are obtained. We measured force-distance and dissipation-distance curves with different tips. Some of the tips show long-range force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM. We also observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy-distance curve.",

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T1 - Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2 × 1)

AU - Özgür Özer, H.

AU - Atabak, Mehrdad

AU - Oral, Ahmet

PY - 2002/12

Y1 - 2002/12

N2 - Si(100)(2 × 1) surface is imaged using a new nc-AFM (non-contact atomic force microscopy)/STM with sub-Ångstrom oscillation amplitudes using stiff hand-made tungsten levers. Simultaneous force gradient and scanning tunneling microscopy images of individual dimers and atomic scale defects are obtained. We measured force-distance and dissipation-distance curves with different tips. Some of the tips show long-range force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM. We also observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy-distance curve.

AB - Si(100)(2 × 1) surface is imaged using a new nc-AFM (non-contact atomic force microscopy)/STM with sub-Ångstrom oscillation amplitudes using stiff hand-made tungsten levers. Simultaneous force gradient and scanning tunneling microscopy images of individual dimers and atomic scale defects are obtained. We measured force-distance and dissipation-distance curves with different tips. Some of the tips show long-range force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM. We also observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy-distance curve.

KW - A. Si (100) surface

KW - E. nc-AFM/STM studies

UR - https://www.scopus.com/pages/publications/0036895431

U2 - 10.1016/S0038-1098(02)00547-1

DO - 10.1016/S0038-1098(02)00547-1

M3 - Article

AN - SCOPUS:0036895431

SN - 0038-1098

VL - 124

SP - 469

EP - 472

JO - Solid State Communications

JF - Solid State Communications

IS - 12

ER -

Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2 × 1)

Abstract

Funding

Keywords

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