TY - GEN
T1 - Truly random number generators based on a double-scroll attractor
AU - Ergün, Salih
AU - Özog̃uz, Serdar
PY - 2006
Y1 - 2006
N2 - Two new random number generators (RNGs) based on a double-scroll attractor are presented. Simulation and experimental results, verifying the feasibility of the circuits, are given. We have numerically verified that the bit streams, obtained from the 1-dimensional Poincaré section of the system, when the map was divided into regions according to distribution, passed the four basic tests of FIPS-140-2 test suite. We have also verified that the binary data, obtained from the hardware realization of the circuit in the same way, passed the full NIST random number test suite. Then, in order to increase the throughput of the generated bit sequences, we have proposed a RNG design which uses a dual oscillator architecture with the chaotic oscillator, Finally, we have experimentally verified that the binary data obtained by this oscillator sampling technique, passed the tests of full NIST random number test suite without post processing for a higher throughput speed. The proposed RNGs can be realized in integrated circuits.
AB - Two new random number generators (RNGs) based on a double-scroll attractor are presented. Simulation and experimental results, verifying the feasibility of the circuits, are given. We have numerically verified that the bit streams, obtained from the 1-dimensional Poincaré section of the system, when the map was divided into regions according to distribution, passed the four basic tests of FIPS-140-2 test suite. We have also verified that the binary data, obtained from the hardware realization of the circuit in the same way, passed the full NIST random number test suite. Then, in order to increase the throughput of the generated bit sequences, we have proposed a RNG design which uses a dual oscillator architecture with the chaotic oscillator, Finally, we have experimentally verified that the binary data obtained by this oscillator sampling technique, passed the tests of full NIST random number test suite without post processing for a higher throughput speed. The proposed RNGs can be realized in integrated circuits.
UR - http://www.scopus.com/inward/record.url?scp=34748900523&partnerID=8YFLogxK
U2 - 10.1109/MWSCAS.2006.382062
DO - 10.1109/MWSCAS.2006.382062
M3 - Conference contribution
AN - SCOPUS:34748900523
SN - 1424401739
SN - 9781424401734
T3 - Midwest Symposium on Circuits and Systems
SP - 322
EP - 326
BT - Proceedings of the 2006 49th Midwest Symposium on Circuits and Systems, MWSCAS'06
T2 - 2006 49th Midwest Symposium on Circuits and Systems, MWSCAS'06
Y2 - 6 August 2006 through 9 August 2007
ER -