Transmission eigenvalues and the nondestructive testing of dielectrics

Fioralba Cakoni; Mehmet Çayören; David Colton

doi:10.1088/0266-5611/24/6/065016

Transmission eigenvalues and the nondestructive testing of dielectrics

Fioralba Cakoni^*
, Mehmet Çayören
, David Colton

^*Corresponding author for this work

Department of Electronics and Communication Engineering

University of Delaware

Research output: Contribution to journal › Article › peer-review

73 Citations (Scopus)

Abstract

We show how transmission eigenvalues can be determined from electromagnetic scattering data and used to determine the presence of cavities in a dielectric.

Original language	English
Article number	065016
Journal	Inverse Problems
Volume	24
Issue number	6
DOIs	https://doi.org/10.1088/0266-5611/24/6/065016
Publication status	Published - 2008

Access to Document

10.1088/0266-5611/24/6/065016

Cite this

@article{a6ce16d4d12540ca94516b53887f3af7,

title = "Transmission eigenvalues and the nondestructive testing of dielectrics",

abstract = "We show how transmission eigenvalues can be determined from electromagnetic scattering data and used to determine the presence of cavities in a dielectric.",

author = "Fioralba Cakoni and Mehmet {\c C}ay{\"o}ren and David Colton",

year = "2008",

doi = "10.1088/0266-5611/24/6/065016",

language = "English",

volume = "24",

journal = "Inverse Problems",

issn = "0266-5611",

publisher = "IOP Publishing Ltd.",

number = "6",

}

TY - JOUR

T1 - Transmission eigenvalues and the nondestructive testing of dielectrics

AU - Cakoni, Fioralba

AU - Çayören, Mehmet

AU - Colton, David

PY - 2008

Y1 - 2008

N2 - We show how transmission eigenvalues can be determined from electromagnetic scattering data and used to determine the presence of cavities in a dielectric.

AB - We show how transmission eigenvalues can be determined from electromagnetic scattering data and used to determine the presence of cavities in a dielectric.

UR - https://www.scopus.com/pages/publications/62649116875

U2 - 10.1088/0266-5611/24/6/065016

DO - 10.1088/0266-5611/24/6/065016

M3 - Article

AN - SCOPUS:62649116875

SN - 0266-5611

VL - 24

JO - Inverse Problems

JF - Inverse Problems

IS - 6

M1 - 065016

ER -

Transmission eigenvalues and the nondestructive testing of dielectrics

Abstract

Access to Document

Other files and links

Fingerprint

Cite this