Transmission eigenvalues and the nondestructive testing of dielectrics

Fioralba Cakoni; Mehmet Çayören; David Colton

doi:10.1088/0266-5611/24/6/065016

Transmission eigenvalues and the nondestructive testing of dielectrics

Fioralba Cakoni^*, Mehmet Çayören, David Colton

^*Corresponding author for this work

Department of Electronics and Communication Engineering

University of Delaware

Research output: Contribution to journal › Article › peer-review

71 Citations (Scopus)

Abstract

We show how transmission eigenvalues can be determined from electromagnetic scattering data and used to determine the presence of cavities in a dielectric.

Original language	English
Article number	065016
Journal	Inverse Problems
Volume	24
Issue number	6
DOIs	https://doi.org/10.1088/0266-5611/24/6/065016
Publication status	Published - 2008

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title = "Transmission eigenvalues and the nondestructive testing of dielectrics",

abstract = "We show how transmission eigenvalues can be determined from electromagnetic scattering data and used to determine the presence of cavities in a dielectric.",

author = "Fioralba Cakoni and Mehmet {\c C}ay{\"o}ren and David Colton",

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volume = "24",

journal = "Inverse Problems",

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AU - Cakoni, Fioralba

AU - Çayören, Mehmet

AU - Colton, David

PY - 2008

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N2 - We show how transmission eigenvalues can be determined from electromagnetic scattering data and used to determine the presence of cavities in a dielectric.

AB - We show how transmission eigenvalues can be determined from electromagnetic scattering data and used to determine the presence of cavities in a dielectric.

UR - https://www.scopus.com/pages/publications/62649116875

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DO - 10.1088/0266-5611/24/6/065016

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SN - 0266-5611

VL - 24

JO - Inverse Problems

JF - Inverse Problems

IS - 6

M1 - 065016

ER -

Transmission eigenvalues and the nondestructive testing of dielectrics

Abstract

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