TY - GEN
T1 - Throughput enhancement for a new time-delay sampled-data system based True Random Bit Generator
AU - Yeniceri, Ramazan
AU - Ustaoǧlu, Buse
AU - Yalçin, Müştak E.
PY - 2013
Y1 - 2013
N2 - In this paper, a throughput enhanced version of a new True Random Bit Generator (TRBG) based on a time-delay sampled-data system is proposed. This new TRBG has both analog and digital parts, which provides the dynamic behavior and the sample and delay process, respectively. The simple system equations and the ease of implementation make this new TRBG very practical. The only required components for the implementation of the proposed system are commonly used Op Amps, resistors and capacitors with a chain of D-type flip-flops. The main contribution of this paper is the increase in random bit generation rate provided by two identical but unsynchronized cooperating circuits compared to the single circuit setup. As experienced, a 2.5 times greater random bit generation rate is achieved by this approach. In order to measure the statistical performance, the contemporary NIST 800-22rev1a Statistical Test Suite is used and it is experienced that the throughput enhancement is achieved with pass results from all these statistical tests.
AB - In this paper, a throughput enhanced version of a new True Random Bit Generator (TRBG) based on a time-delay sampled-data system is proposed. This new TRBG has both analog and digital parts, which provides the dynamic behavior and the sample and delay process, respectively. The simple system equations and the ease of implementation make this new TRBG very practical. The only required components for the implementation of the proposed system are commonly used Op Amps, resistors and capacitors with a chain of D-type flip-flops. The main contribution of this paper is the increase in random bit generation rate provided by two identical but unsynchronized cooperating circuits compared to the single circuit setup. As experienced, a 2.5 times greater random bit generation rate is achieved by this approach. In order to measure the statistical performance, the contemporary NIST 800-22rev1a Statistical Test Suite is used and it is experienced that the throughput enhancement is achieved with pass results from all these statistical tests.
UR - http://www.scopus.com/inward/record.url?scp=84892660012&partnerID=8YFLogxK
U2 - 10.1109/ecctd.2013.6662263
DO - 10.1109/ecctd.2013.6662263
M3 - Conference contribution
AN - SCOPUS:84892660012
SN - 9783000437854
T3 - 2013 European Conference on Circuit Theory and Design, ECCTD 2013 - Proceedings
BT - 2013 European Conference on Circuit Theory and Design, ECCTD 2013 - Proceedings
PB - IEEE Computer Society
T2 - 2013 European Conference on Circuit Theory and Design, ECCTD 2013
Y2 - 8 September 2013 through 12 September 2013
ER -