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The impact of trench geometry and processing on the performance and reliability of low voltage power UMOSFETs
S. A. Suliman, N. Gallogunta, L. Trabzon, J. Hao, G. Dolny, R. Ridley, T. Grebs, J. Benjamin, C. Kocon, J. Zeng, C. M. Knoedler, M. Horn, O. O. Awadelkarim, S. J. Fonash, J. Ruzyllo
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
6
Citations
(Scopus)