TY - JOUR
T1 - The effect of nitrogen pressure on cathodic arc deposited NbN thin films
AU - Cansever, N.
AU - Danişman, M.
AU - Kazmanli, K.
PY - 2008/8/15
Y1 - 2008/8/15
N2 - NbN thin films were deposited on non-standard grade high speed steel (HSS) (79.90 wt.% Fe, 0.71 wt.% C, 6.09 wt.% W, 4.52 wt.% Mo, 3.95 wt.% Cr, 1.82 wt.% Co, 1.75 wt.% V and a hardness of 65 HRC) using cathodic arc deposition at 0.125, 0.5, 1.0 and 1.5 Pa nitrogen pressures (PN2), with a bias voltage of - 150 V. X-ray diffraction (XRD), Scanning Electron Microscope (SEM), Nanoindentation and Rockwell C analysis were used to characterize the thin films in order to identify the NbN phases and to investigate the influence of PN2 on mechanical properties. Hexagonal β-Nb2N, ε-NbN and δ′-NbN0.95 are identified in XRD analysis. Hardness values derived by nanoindentation technique are 20 GPa for β-Nb2N, ε-NbN and 40 GPa for δ'-NbN0.95. Due to the complexity of phase system special attention was focused on identification of NbN phases by deconvolating the XRD peaks especially at 0.5 Pa in which both ε-NbN and β-Nb2N were found. Rockwell C analysis revealed that the film adhesion is found to be poor at lower PN2, due to the brittle nature of β-Nb2N.
AB - NbN thin films were deposited on non-standard grade high speed steel (HSS) (79.90 wt.% Fe, 0.71 wt.% C, 6.09 wt.% W, 4.52 wt.% Mo, 3.95 wt.% Cr, 1.82 wt.% Co, 1.75 wt.% V and a hardness of 65 HRC) using cathodic arc deposition at 0.125, 0.5, 1.0 and 1.5 Pa nitrogen pressures (PN2), with a bias voltage of - 150 V. X-ray diffraction (XRD), Scanning Electron Microscope (SEM), Nanoindentation and Rockwell C analysis were used to characterize the thin films in order to identify the NbN phases and to investigate the influence of PN2 on mechanical properties. Hexagonal β-Nb2N, ε-NbN and δ′-NbN0.95 are identified in XRD analysis. Hardness values derived by nanoindentation technique are 20 GPa for β-Nb2N, ε-NbN and 40 GPa for δ'-NbN0.95. Due to the complexity of phase system special attention was focused on identification of NbN phases by deconvolating the XRD peaks especially at 0.5 Pa in which both ε-NbN and β-Nb2N were found. Rockwell C analysis revealed that the film adhesion is found to be poor at lower PN2, due to the brittle nature of β-Nb2N.
KW - Cathodic arc deposition
KW - Deconvolation
KW - Nanoindentation
KW - NbN thin films
KW - XRD
UR - http://www.scopus.com/inward/record.url?scp=50449096439&partnerID=8YFLogxK
U2 - 10.1016/j.surfcoat.2008.06.158
DO - 10.1016/j.surfcoat.2008.06.158
M3 - Article
AN - SCOPUS:50449096439
SN - 0257-8972
VL - 202
SP - 5919
EP - 5923
JO - Surface and Coatings Technology
JF - Surface and Coatings Technology
IS - 24
ER -