Abstract
Rationale and Objectives: To differentiate early-onset schizophrenia (EOS) from early-onset bipolar disorder (EBD) using surface-based morphometry measurements and brain volumes using machine learning (ML) algorithms. Method: High-resolution T1-weighted images were obtained to measure cortical thickness (CT), gyrification, gyrification index (GI), sulcal depth (SD), fractal dimension (FD), and brain volumes. After the feature selection step, ML classifiers were applied for each feature set and the combination of them. The SHapley Additive exPlanations (SHAP) technique was implemented to interpret the contribution of each feature. Findings: 144 adolescents (16.2 ± 1.4 years, female = 39%) with EOS (n = 81) and EBD (n = 63) were included. The Adaptive Boosting (AdaBoost) algorithm had the highest accuracy (82.75%) in the whole dataset that includes all variables from Destrieux atlas. The best-performing algorithms were K-nearest neighbors (KNN) for FD subset, support vector machine (SVM) for SD subset, and AdaBoost for GI subset. The KNN algorithm had the highest accuracy (accuracy = 79.31%) in the whole dataset from the Desikan-Killiany-Tourville atlas. Conclusion: This study demonstrates the use of ML in the differential diagnosis of EOS and EBD using surface-based morphometry measurements. Future studies could focus on multicenter data for the validation of these results.
Original language | English |
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Pages (from-to) | 3597-3604 |
Number of pages | 8 |
Journal | Academic Radiology |
Volume | 31 |
Issue number | 9 |
DOIs | |
Publication status | Published - Sept 2024 |
Bibliographical note
Publisher Copyright:© 2024 The Association of University Radiologists
Keywords
- Bipolar disorder
- Early-onset
- K-nearest neighbors
- Machine learning
- Schizophrenia
- Support vector machine